研究目的
To develop a packaging inspection system using synthetic aperture focusing technique to detect hazardous materials in packages by reconstructing internal images at millimeter-wave frequencies.
研究成果
The reformulated SAF algorithm successfully reconstructs sectional images of objects inside packages using millimeter-wave frequencies, as demonstrated with finite element simulation. This approach shows potential for automating package inspection to detect hazardous materials, with recommendations for further improvements in resolution through broader bandwidth and advanced propagation models.
研究不足
The study is based on simulation data, not experimental validation. The reconstruction resolution may be limited by the use of Fresnel approximation and single-frequency illumination; improvements could involve wide-band signals, far-field focal points, and full-field back-propagation formulations.
1：Experimental Design and Method Selection:
The study reformulates the synthetic aperture focusing (SAF) algorithm for millimeter-wave imaging. It uses finite element simulation to model the system, involving back-propagation of electric fields and Fourier transform operations to reconstruct images.
2：Sample Selection and Data Sources:
A simulated aluminum gun placed in a teflon box with half-wavelength side-wall thickness is used as the package under test (PUT). Data is generated through finite element simulation at 80 GHz.
3：List of Experimental Equipment and Materials:
No specific physical equipment is mentioned; the work is simulation-based using finite element methods. Materials include aluminum (for the gun) and teflon (for the box).
4：Experimental Procedures and Operational Workflow:
The box is illuminated with a plane wave at 80 GHz. Total electric fields are measured at an observation plane 8 wavelengths away. Fields are collected over the observation domain, Fourier transforms are applied, and fields are back-propagated to the synthetic lens focal plane using Fresnel approximation to reconstruct the image.
5：Data Analysis Methods:
Data analysis involves 2D Fourier and inverse Fourier transforms to process the electromagnetic field data and reconstruct sectional images. The resolution is assessed by comparing reconstructed images with the original.
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