研究目的
To research and introduce the process flow of a full-automatic wafer level flip chip machine for IC semiconductor packaging, addressing the gap in domestic equipment development and improving industry capacity.
研究成果
The full-automatic wafer level flip chip machine achieves a processing time of 1.8s per chip and a positioning accuracy of 10μm, filling a gap in domestic semiconductor equipment. However, stability and module coordination need improvement for better performance.
研究不足
The quality of solid crystal welding is not always stable, and the coordination between modules can be further optimized to improve equipment performance.
1:Experimental Design and Method Selection:
The study involves designing and testing a full-automatic wafer level flip chip machine with mechanical, electronic control, image recognition, and software systems. The method includes using heating, pressing, and ultrasonic energy for solid-state soldering.
2:Sample Selection and Data Sources:
The equipment is tested with wafer substrates of various sizes (4-inch, 6-inch, 8-inch, 12-inch) and ceramic substrates. Data is collected from the machine's operation and microscope observations.
3:List of Experimental Equipment and Materials:
The machine includes modules such as wafer ring loading/unloading, wafer table, flip chip, die bonding head, dispensing, ultrasonic and heating/pressing, wafer substrate table, and automatic loading/unloading. Cameras and lenses are used for image recognition.
4:Experimental Procedures and Operational Workflow:
The process involves initializing the machine, loading wafer rings and substrates, flipping chips, die bonding with dispensing and heating/pressing, and unloading. Steps include visual recognition, angle correction, and leak detection.
5:Data Analysis Methods:
Timing is used to measure cycle time (1.8s per chip), and a measuring microscope is used to assess positioning accuracy (10μm).
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