1：Experimental Design and Method Selection:

The study uses magnetron sputtering for deposition and two annealing methods (furnace annealing and laser annealing) to treat the films. The rationale is to compare the effects of different annealing processes on optoelectronic and bending fatigue properties.

2：Sample Selection and Data Sources:

AZ and IAZ films with varying Ag and Zr compositions (e.g., Ag66Zr34, Ag50Zr50) are deposited on glass substrates. The glass substrates are OA-10 G type from Nippon Electric Glass Co.

3：List of Experimental Equipment and Materials:

Magnetron sputtering system (Kao Duen Co.), Ag, Zr, and ITO targets (purities 99.99% for Ag and Zr, ITO target with 90 wt% In2O3 and 10 wt% SnO), glass substrates, furnace for annealing, fiber laser (SPI-12, UK; 1064 nm wavelength), four-point probe (SR-H1000C), UV–vis-IR spectrophotometer (Lambda 35, PerkinElmer), X-ray diffractometer (XRD, Bruker D8), scanning electron microscopy (SEM, JEOL JSM 7600F), energy dispersive X-ray spectrometry (EDS), dual-focus ion beam system (FIB, SEIKO SMI 3050), transmission electron microscopy (TEM, JEOL 3010).

4：99% for Ag and Zr, ITO target with 90 wt% In2O3 and 10 wt% SnO), glass substrates, furnace for annealing, fiber laser (SPI-12, UK; 1064 nm wavelength), four-point probe (SR-H1000C), UV–vis-IR spectrophotometer (Lambda 35, PerkinElmer), X-ray diffractometer (XRD, Bruker D8), scanning electron microscopy (SEM, JEOL JSM 7600F), energy dispersive X-ray spectrometry (EDS), dual-focus ion beam system (FIB, SEIKO SMI 3050), transmission electron microscopy (TEM, JEOL 3010). Experimental Procedures and Operational Workflow:

4. Experimental Procedures and Operational Workflow: Films are deposited via magnetron sputtering. FA is performed at 100–400 °C with a heating rate of 5 °C/min and holding time of 1 h. LA is conducted with repetition rates of 100–400 kHz and irradiation powers of 42–545 mW, with laser scanning speed of 5 mm/s, spot size of 40 μm, and pulse duration of 30 ns. Sheet resistance and optical transmittance are measured. Microstructure is characterized using XRD, SEM, EDS, FIB, and TEM. Bending fatigue tests are performed with a bend radius of 7 mm at 1 cycle/s.

5：Data Analysis Methods:

Sheet resistance and transmittance data are used to calculate the figure of merit (?TC = T^10 / Rs). Statistical analysis is implied through comparison of values across samples.