1：Experimental Design and Method Selection:

The study employs a chemical modification method using TEMPO and [Ph3C]BF4 in organic solvents for thinning and passivation of BP. DFT calculations are used to model bonding mechanisms.

2：Sample Selection and Data Sources:

BP flakes are obtained by mechanical exfoliation from bulk BP (Smart Elements, USA) and transferred onto SiO2/Si substrates.

3：List of Experimental Equipment and Materials:

Equipment includes AFM (Bruker Dimension Icon), Raman microscope (Renishaw InVia), XPS (Thermo Scientific ESCALAB 250 Xi), HR-TEM (FEI Tecnai G2 F20), ESR spectrometer (Bruker EMXplus), and semiconductor parameter analyzer (Agilent B1500A). Materials include TEMPO, [Ph3C]BF4, dichloromethane, acetone, water, and solvents like NMP and IPA.

4：Experimental Procedures and Operational Workflow:

BP flakes are immersed in modification solutions with varying concentrations of TEMPO and [Ph3C]BF4 in different solvents (e.g., dichloromethane for thinning, water/acetone mixture for passivation) for specified durations, followed by washing and drying. FET devices are fabricated using electron-beam lithography and metal deposition. Photocurrent measurements are performed using SPCM with lasers.

5：Data Analysis Methods:

Data analysis involves AFM for thickness measurement, Raman spectroscopy for structural integrity, XPS for elemental analysis, and electrical characterization for FET performance.