研究目的
Investigating the structural ordering of the PTB7 polymer at a mesoscopic scale and its influence on optoelectronic and electronic properties, including the role of film thickness and the competition between J- and H-aggregates.
研究成果
The study demonstrates that the optoelectronic and electronic properties of PTB7 films are strongly influenced by film thickness, with a critical threshold around 130 nm due to structural ordering and competition between J- and H-aggregates. The theoretical analysis links this to the drying process, where skin formation during drying affects structural development. This mesoscale effect has implications for device performance and experimental practices in organic electronics.
研究不足
The study is limited to PTB7 polymer films and specific experimental conditions (e.g., solvent mixtures, spin coating parameters). The theoretical model assumes simplified conditions (e.g., constant mass transfer coefficient, neglect of convective effects), which may not capture all real-world complexities. The findings may not generalize to other polymers or preparation methods without further validation.
1:Experimental Design and Method Selection:
The study employs a combination of experimental techniques (UV-Vis absorption, photoluminescence, surface photovoltage, CELIV, ER-EIS, GIWAXS) and theoretical modeling to analyze the structural ordering and properties of PTB7 films with varying thicknesses. The theoretical part involves a drying model based on the Péclet number to explain skin formation during film drying.
2:Sample Selection and Data Sources:
PTB7 polymer films were prepared by spin coating from solutions in toluene and chloroform mixtures, with concentrations of 10 mg/mL and 20 mg/mL, cast onto quartz glass, glass/ITO, and n-doped silicon substrates. Film thicknesses ranged from 40 nm to 300 nm, controlled by spin speed and solution concentration.
3:List of Experimental Equipment and Materials:
Equipment includes a spin coater (Laurell WS-650-MZ-23NPP), profilometer (Dektak XT-E, Bruker), UV-Vis spectrometer (Lambda 1050, Perkin Elmer), fluorimeter (FSL 920, Edinburgh Instruments), cryostat (Optistat DN-V, Oxford Instruments), oscilloscope (OWON DS 7102 V), function generator (Agilent 33250 A), impedance analyzer (Solartron analytical model 1260), and GIWAXS system (Nanostar, Bruker). Materials include PTB7 polymer (Sigma Aldrich), solvents (toluene, chloroform), and substrates.
4:Experimental Procedures and Operational Workflow:
Films were spin-coated at speeds from 4500 to 1000 rpm, dried at 100°C in a nitrogen atmosphere. Thickness was measured with a profilometer. Absorption and PL spectra were recorded. SPV measurements were conducted with specific arrangements. CELIV was used for mobility measurements. ER-EIS was performed in a three-electrode cell with specific parameters. GIWAXS was done at an incident angle of 0.2°.
5:2°. Data Analysis Methods:
5. Data Analysis Methods: Data were analyzed using fitting procedures for SPV spectra to determine exciton diffusion length, CELIV for mobility calculation, ER-EIS for DOS determination, and GIWAXS for structural analysis. Theoretical modeling involved Péclet number analysis for drying behavior.
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profilometer
Dektak XT-E
Bruker
Measures the thickness of films with high resolution.
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UV/VIS/NIR spectrometer
Lambda 1050
Perkin Elmer
Measures absorption spectra of the films.
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fluorimeter
FSL 920
Edinburgh Instruments
Measures photoluminescence spectra.
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cryostat
Optistat DN-V
Oxford Instruments
Provides vacuum environment for PL measurements.
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function generator
33250 A
Agilent
Generates linearly increasing voltage pulses for CELIV measurements.
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GIWAXS system
Nanostar
Bruker
Performs grazing-incidence wide-angle X-ray scattering to analyze structural ordering in films.
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spin coater
WS-650-MZ-23NPP
Laurell
Used for spin coating polymer solutions onto substrates to create thin films with controlled thickness.
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oscilloscope
DS 7102 V
OWON
Used in CELIV measurements to measure current response over time.
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impedance analyzer
1260
Solartron analytical
Used for energy-resolved electrochemical impedance spectroscopy (ER-EIS) to measure density of states.
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