研究目的
To investigate the origin of anisotropy and compositional dependence of phonon and electron transport in ZnO based natural superlattices and the role of atomic layer interfaces.
研究成果
The atomic layer SL interfaces induce strong anisotropy in transport properties, acting as phonon barriers with Kapitza resistance dependent on SL spacing, and providing electron-conductive paths with higher mobility. Electron potential barrier heights are proportional to natural band discontinuities. This work provides insights for designing layer-structured compounds for energy applications.
研究不足
The study is limited to specific ZnO-based natural superlattices and may not generalize to other materials. Measurements on polycrystals instead of single crystals might introduce grain boundary effects, although efforts were made to minimize this. High-temperature Hall measurements had poor reproducibility. Computational challenges exist for superlattices with random ion distributions.
1:Experimental Design and Method Selection:
The study involved synthesizing strongly textured bulk polycrystals of various ZnO-based natural superlattices (In2O3(ZnO)k, InFeO3(ZnO)4, InGaO3(ZnO)4, Ga2O3(ZnO)k) with high phase purity. Characterization and measurements were performed for both in-plane and cross-sectional directions to reveal anisotropic transport properties. First-principles calculations were used for phonon transport properties of InGaO3(ZnO)
2:Sample Selection and Data Sources:
Samples were synthesized using a wet chemistry sol-gel method with precursor powders, sintered via spark plasma sintering, and annealed to achieve single-phase purity. Data were obtained from XRD, SEM, HRTEM, UV-VIS-NIR spectrophotometry, thermal diffusivity, electrical conductivity, Seebeck coefficient, and Hall measurements.
3:List of Experimental Equipment and Materials:
Equipment includes spark plasma sintering system (LABOX-325, Sinter Land?), XRD (Rigaku D/Max 2500 PC), FE-SEM (Zeiss? Supra55), HRTEM (JEOL?, JEM-2100F), UV-VIS-NIR spectrophotometer (SHIMADZU?, UV-3600 Plus), laser flash apparatus (Netzsch Micro Flash? LFA 457), electrical property measurement system (Netzsch SBA 458 Nemesis), Hall measurement system (Ecopia HMS-5500). Materials include indium nitrate, gallium nitrate, ferric nitrate, zinc acetate, oxalic acid, nitric acid.
4:0). Materials include indium nitrate, gallium nitrate, ferric nitrate, zinc acetate, oxalic acid, nitric acid. Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Synthesis involved sol-gel method, calcination, sintering, annealing, and cutting samples for measurements. Characterization included XRD for phase purity and texture, SEM for microstructure, HRTEM for fine structure, optical spectroscopy for bandgap, thermal diffusivity measurements, electrical conductivity and Seebeck coefficient measurements, and Hall measurements. Computational details involved DFT calculations for phonon properties.
5:Data Analysis Methods:
Data were analyzed using orientation index for XRD, Tauc equation for bandgap, Kopp-Neumann rule for specific heat, Wiedemann-Franz law for electronic thermal conductivity, SPB model for effective electron mass, and interface energy barrier transport model for electron potential barriers. Phonon properties were calculated using PHONOPY and ShengBTE packages.
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X-ray Diffractometer
D/Max 2500 PC
Rigaku
Phase purity and crystal structure determination
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Field-Emission Scanning Electron Microscope
Supra55
Zeiss
Grain size and morphology examination
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High Resolution Transmission Electron Microscope
JEM-2100F
JEOL
Fine structure and preferred orientation observation
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UV-VIS-NIR Spectrophotometer
UV-3600 Plus
SHIMADZU
Optical diffuse-reflectance spectra acquisition
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Spark Plasma Sintering System
LABOX-325
Sinter Land
Sintering of bulk polycrystal samples
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Laser Flash Apparatus
LFA 457
Netzsch Micro Flash
Thermal diffusivity measurement
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Electrical Property Measurement System
SBA 458 Nemesis
Netzsch
Electrical conductivity and Seebeck coefficient measurement
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Hall Measurement System
HMS-5500
Ecopia
Hall coefficient measurement
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Diamond Wire Cutting Machine
STX202A
SY-Kejing
Cutting samples for cross-sectional measurements
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Precision Ion Polishing System
Model 691
Gatan
Ion beam milling for TEM sample preparation
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