- 标题
- 摘要
- 关键词
- 实验方案
- 产品
-
Universal Testing Apparatus Implementing Various Repetitive Mechanical Deformations to Evaluate the Reliability of Flexible Electronic Devices
摘要： A requirement of flexible electronic devices is that they maintain their electrical performance during and after repetitive mechanical deformation. Accordingly, in this study, a universal test apparatus is developed for in-situ electrical conductivity measurements for flexible electrodes that are capable of applying various mechanical deformations such as bending, twisting, shearing, sliding, stretching, and complex modes consisting of two simultaneous deformations. A novel method of deforming the specimen in an arc to induce uniform bending stress in single and alternating directions is also proposed with a mathematically derived control method. As an example of the arc bending method, the changes in the resistance of the printed radio frequency identification (RFID) tag antennas were measured by applying repetitive inner bending, outer bending, and alternating inner-outer bending. After 5000 cycles, the increases in resistance of the specimens that were subjected to inner or outer bending only were under 30%; however, specimens that were subjected to alternating inner-outer bending showed an increase of 135% in resistance. It is critical that the reliability of flexible electronic devices under various mechanical deformations be determined before they can be commercialized. The proposed testing apparatus can readily provide various deformations that will be useful to inform the design of device shapes and structures to accommodate deformations during use.
关键词： mechanical deformation,printed electronics,reliability,test apparatus,flexible electronics
更新于2025-09-23 15:22:29
-
Urban Tomographic Imaging Using Polarimetric SAR Data
摘要： In this paper, we investigate the potential of polarimetric Synthetic Aperture Radar (SAR) tomography (Pol-TomoSAR) in urban applications. TomoSAR exploits the amplitude and phase of the received data and offers the possibility to resolve multiple scatters lying in the same range–azimuth resolution cell. In urban environments, this issue is very important since layover causes multiple coherent scatterers to be mapped in the same range–azimuth image pixel. To achieve reliable and accurate results, TomoSAR requires a large number of multi-baseline acquisitions which, for satellite-borne SAR systems, are collected with long time intervals. Then, accurate tomographic reconstructions would require multiple scatterers to remain stable between all the acquisitions. In this paper, an extension of a generalized likelihood ratio test (GLRT)-based tomographic approach, denoted as Fast-Sup-GLRT, to the polarimetric data case is introduced, with the purpose of investigating if, in urban applications, the use of polarimetric channels allows for reduction of the number of baselines required to achieve a given scatterer’s detection performance. The results presented show that the use of dual polarization data allows the proposed detector to work in an equivalent or better way than use of a double number of independent single polarization channels.
关键词： generalized likelihood ratio test,synthetic aperture radar,sparse signals,polarimetry,radar detection,tomography
更新于2025-09-23 15:22:29
-
White-light emissive upconversion nanoparticles for visual and colorimetric determination of the pesticide thiram
摘要： The authors describe the use of white-light emitting upconversion nanoparticles (WL-UCNPs) for visual detection of the pesticide thiram. The method is demonstrated to undergo a better discernable color change upon target binding. The WL-UCNPs are modified with the lead(II)-dithizone complex which acts as the energy acceptor and recognition unit. This leads to quenching of the blue (475 nm) and green (545 nm) emissions of the WL-UCNPs, while the red emission (650 nm) remains unaffected. Upon addition of thiram, the quenched emissions are recovered, with a linear signal increase in the range from 2 nM to 20 nM of thiram and a limit of detection of 0.26 nM. The nanoprobe was further integrated into a test paper for visual detection. The concentration-dependent color change that varies from red to cyan and bluish violet and then to white can be visually distinguished.
关键词： Lead-dithizone complex,Color-differentiation,Upconversional nanoprobe,Test paper,Energy transfer
更新于2025-09-23 15:22:29
-
[IEEE 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Atlanta, GA, USA (2018.10.31-2018.11.2)] 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Static and Dynamic Characterization of a 2.5 kV SiC MOSFET
摘要： In this work, a 2.5 kV discrete SiC MOSFET manufactured by GE with a 58 A current rating and a 40 m? on-resistance is characterized, both statically and dynamically. The high current capabilities within a discrete package at 2.5 kV MOSFET offers improved performance differentiation when compared to both traditional 1.7 kV discrete devices and 3.3 kV power modules. This device is characterized statically, dynamically and under increased temperature conditions up to 200oC. A clamped, inductive test circuit is used to conduct the double pulse tests necessary to determine the switching energy losses. These measurements are compared to a commercially available SiC MOSFET that is similarly rated.
关键词： 2.5 kV MOSFET,Static Characterization,Double Pulse Test
更新于2025-09-23 15:22:29
-
Apply DFT Integrated Enhanced EBAC Methodology on Defect Isolations
摘要： Design for test (DFT) has been widely applied to digital circuit failure analysis (FA) in semiconductor industries. The FA methods based on DFT involve layer-by-layer checks using a polisher and an SEM for defect identification and localization. Yet these methods have limitations with high risks of sample damages. Besides, they are highly dependent on the technical proficiencies of operators and, thus, they are not effective for precise defect isolations. This problem has been aggravated, especially at advanced nodes. The nano-probing electron beam absorbed current (EBAC) has significant advantages on precisely locating defects. This technique is to directly identify specific defects without layer-by-layer checks. Therefore, it can minimize sample damages during sample pretreatment. EBAC is an efficient technique to isolate the defects when the circuit is at the floating condition. Because the ground lines exist almost everywhere in a chip and they are for, e.g., electronic static discharge charge releases or connecting with sources for pickup, EBAC becomes a natural option for us. However, due to poor EBAC images, EBAC’s applications are restricted when the circuits under test have grounding paths. In this paper, we propose two enhanced EBAC analysis methods, based on the DFT and EBAC integrated system, for the defect isolations with grounded connections. It is the first time the DFT and EBAC integrated system is reported, and we successfully demonstrated EBAC applicability by real FA cases.
关键词： Design for test (DFT),Grounding line,Fault isolation,Electron beam absorbed current (EBAC),Failure analysis (FA)
更新于2025-09-23 15:21:21
-
[IEEE 2018 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2018.6.18-2018.6.22)] 2018 IEEE Symposium on VLSI Technology - Metal/P-type GeSn Contacts with Specific Contact Resistivity down to 4.4×10 <sup>?10</sup> Ω-cm <sup>2</sup>
摘要： Ga and Sn surface-segregated p+-GeSn (Seg. p+-GeSn) was grown by molecular beam epitaxy (MBE) to achieve an average active Ga doping concentration of 3.4×1020 cm-3 and surface Sn composition of more than 8%. This enables the realization of record-low specific contact resistivity ρc down to 4.4×10-10 ?-cm2. The average ρc extracted from 14 sets of Ti/Seg. p+-GeSn Nano-TLM test structures, a collection of more than 90 devices is 6.5×10-10 ?-cm2. This is also the lowest ρc for non-laser-annealed contacts. Ti contacts to p+-GeSn films with and without Ga and Sn surface segregation were fabricated. It is shown that the segregation of Ga and Sn at the Ti/p+-GeSn interface leads to 50% reduction in ρc as compared with a sample without segregation.
关键词： Ga and Sn surface-segregated p+-GeSn,molecular beam epitaxy,specific contact resistivity,Nano-TLM test structures
更新于2025-09-23 15:21:21
-
[IEEE 2019 IEEE SENSORS - Montreal, QC, Canada (2019.10.27-2019.10.30)] 2019 IEEE SENSORS - Large-area, Fast responding Flexible UV Photodetector realized by a Facile Method
摘要： A new approach for text-independent phoneme segmentation at sampling point level is proposed in this paper. The algorithm consists of two phases: First, the voiced sections in speech data are detected using the information of vocal folds vibration contained in electroglottograph (EGG). A Hilbert envelope feature is adopted to achieve sampling point level detection accuracy. Second, the voiced sections and other sections are treated separately. Each voiced section is divided into several candidate phonemes using the Viterbi algorithm. Then adjacent candidate phonemes are merged based on a Hotellings T-square test method. For other sections, the unvoiced consonants are detected from silence based on a singularity exponent feature. Comparison experiments show that the proposed method has better performance than the existing ones for a variety of tolerances, and is more robust to noise.
关键词： Hotellings T-square test,Singularity Exponent,Viterbi algorithm,Electroglottograph,Hilbert Envelope
更新于2025-09-23 15:21:01
-
[IEEE 2017 International Conference on Computer Technology, Electronics and Communication (ICCTEC) - Dalian, China (2017.12.19-2017.12.21)] 2017 International Conference on Computer Technology, Electronics and Communication (ICCTEC) - Three-Dimensional Pulse Electric Field Test System with Optical Fiber
摘要： A three-dimensional pulse electric field system with optical fiber is developed. It is made up of electric field testing probe, optical transmission system, optical receiver and display, which can realize three-dimensional pulse electric field measurement in the whole space. This paper introduced the three-Dreceiving antenna, the three-D electric field signal synthesis and photoelectric receiver and then analyzed the design of the three-D receiving antenna and the method of last, the three dimensional electric field synthesis. At performance of the testing system is measured. Results show that the system has good test performance whose bandwidth can reach 1KHz-1GHz, dynamic range can be up to 60dB.
关键词： dynamic range,bandwidth test,Pulse electric field,3-D electric field sensor
更新于2025-09-23 15:21:01
-
Wideband 4 ?? 4 Butler Matrix in The Printed Ridge Gap Waveguide Technology for Millimeter Wave Applications
摘要： An underground nuclear explosion (UNE) can generate a shock wave that lofts surface material, resulting in surface changes that might be detectable. The Comprehensive Nuclear Test-Ban Treaty (CTBT) allows ground and airborne spectral and thermal imaging to help locate such events. Landsat 5 data on the 1998 Indian and Pakistani tests are used here to demonstrate that there are detectable changes in surface features which might be used to localize an underground nuclear test and to develop change detection techniques speci?c to the use of satellite data to support a CTBT on-site inspection. Landsat 5 has been active for over 20 years providing repeat coverage of the Earth’s surface every 16 days. Most locations have Landsat data available for a variety of dates, allowing for statistical analysis of the data to understand temporal trends and data variability on a pixel-by-pixel basis. Given the right conditions, these usual patterns of change (such as seasonal changes or weathering) can be discerned from unusual patterns of change, such as features relating to a UNE. This paper extends known change detection techniques to a temporal series of data and shows that multispectral change detection can be used to help localize a UNE.
关键词： multispectral change detection,Comprehensive Nuclear Test-Ban Treaty (CTBT),covariance matrix Landsat 5,Mahalanobis distance
更新于2025-09-23 15:21:01
-
[IEEE 2020 International Conference on Computing, Networking and Communications (ICNC) - Big Island, HI, USA (2020.2.17-2020.2.20)] 2020 International Conference on Computing, Networking and Communications (ICNC) - On Performance of Multiuser Underwater Wireless Optical Communication Systems
摘要： This paper presents an apparatus and methodology for an advanced accelerated power cycling test of insulated-gate bipolar transistor (IGBT) modules. In this test, the accelerated power cycling test can be performed under more realistic electrical operating conditions with online wear-out monitoring of tested power IGBT module. The various realistic electrical operating conditions close to real three-phase converter applications can be achieved by the simple control method. Further, by the proposed concept of applying the temperature stress, it is possible to apply various magnitudes of temperature swing in a short cycle period and to change the temperature cycle period easily. Thanks to a short temperature cycle period, test results can be obtained in a reasonable test time. A detailed explanation of apparatus such as configuration and control methods for the different functions of accelerated power cycling test setup is given. Then, an improved in situ junction temperature estimation method using on-state collector–emitter voltage VC E O N and load current is proposed. In addition, a procedure of advanced accelerated power cycling test and test results with 600 V, 30 A transfer molded IGBT modules are presented in order to verify the validity and effectiveness of the proposed apparatus and methodology. Finally, physics-of-failure analysis of tested IGBT modules is provided.
关键词： power cycling test,physics-of-failure,Failure mechanism,lifetime model,insulated-gate bipolar transistor module,reliability
更新于2025-09-23 15:21:01