研究目的
Investigating the structural and optical properties of PVA capped SnS thin films grown by chemical bath deposition for solar cell applications.
研究成果
PVA capped SnS thin films were successfully deposited using CBD technique. The films exhibited polycrystalline nature with orthorhombic structure and high optical absorption coefficient. The optical band gap decreased with increasing bath temperature, attributed to quantum confinement effect. The films are promising for photovoltaic applications.
研究不足
The study is limited to the characterization of structural and optical properties of PVA capped SnS thin films. The application in photovoltaic devices is suggested but not demonstrated.
1:Experimental Design and Method Selection
Chemical bath deposition (CBD) technique was used to grow SnS nanocrystals capped by PVA at different bath temperatures ranging from 50 to 80 °C.
2:Sample Selection and Data Sources
Glass substrates were used for the deposition of SnS films. The films were characterized using X-ray diffraction, Raman spectroscopy, FTIR spectroscopy, SEM, AFM, and UV-VIS-NIR spectrophotometry.
3:List of Experimental Equipment and Materials
Stannous chloride (SnCl2, 2H2O), thioacetamide (C2H5NS), tartaric acid (C4H6O6), polyvinyl alcohol (PVA), glass substrates, Burker (D8 Advance) X-ray diffractometer, DI-POLAR XY 800 Raman spectrometer, Thermo Nicolet FTIR spectrophotometer, Carl Zeiss EVO 50 scanning electron microscope, Solver Nano NT-MDT atomic force microscope, JASCO V-770 UV-VIS-NIR spectrophotometer.
4:Experimental Procedures and Operational Workflow
PVA solution was prepared and mixed with stannous chloride and tartaric acid. Thioacetamide was added to the solution, and the mixture was stirred. Cleaned glass substrates were immersed into the solution to deposit SnS films at different bath temperatures for 90 minutes. The deposited films were cleaned and dried.
5:Data Analysis Methods
X-ray diffraction data was analyzed using Debye-Scherrer formula and Williamson-Hall plot. Raman and FTIR spectra were analyzed for phase confirmation and functional groups. SEM and AFM images were analyzed for morphology and topography. Optical properties were analyzed using Tauc plots.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
X-ray diffractometer
D8 Advance
Burker
Structural analysis of thin films
暂无现货
预约到货通知
-
Scanning electron microscope
EVO 50
Carl Zeiss
Morphological studies
-
UV-VIS-NIR spectrophotometer
V-770
JASCO
Optical transmittance measurements
暂无现货
预约到货通知
-
Raman spectrometer
DI-POLAR XY 800
Phase confirmation and structural analysis
暂无现货
预约到货通知
-
FTIR spectrophotometer
Thermo Nicolet
Identification of functional groups
暂无现货
预约到货通知
-
Atomic force microscope
Solver Nano NT-MDT
Surface topography analysis
暂无现货
预约到货通知
-
登录查看剩余4件设备及参数对照表
查看全部