研究目的
Investigating the microscopic structural and optoelectronic properties of Cs-Pb-Br thin films prepared by different synthesis methods for potential use in perovskite solar cells.
研究成果
The correlative microscopy approach revealed that obtaining single-phase CsPbBr3 films is non-trivial and depends on the synthesis method and growth parameters. Secondary phases were identified in both spin-coated and coevaporated films, suggesting the need for further research to improve synthesis reproducibility.
研究不足
The study highlights the difficulty in obtaining single-phase CsPbBr3 films, indicating a need for better control over synthesis methods and growth parameters. The presence of secondary phases and their distribution within the films were identified as challenges.
1：Experimental Design and Method Selection:
The study involved preparing Cs-Pb-Br thin films by spin-coating and coevaporation on different substrates, followed by annealing.
2：Sample Selection and Data Sources:
Samples included a CsPbBr3 powder sample, spin-coated and coevaporated thin films on glass and a TEM Cu-grid.
3：List of Experimental Equipment and Materials:
Equipment used included a Panalytical X'Pert Pro MPD diffractometer for XRD, TEM Libra 200 microscope for TEM imaging, Zeiss UltraPlus SEM for EDX, and a Zeiss MERLIN SEM for CL measurements.
4：Experimental Procedures and Operational Workflow:
Structural, compositional, and optoelectronic properties were analyzed using XRD, TEM, SEM, EDX, and CL techniques.
5：Data Analysis Methods:
Data analysis involved azimuthal integration of diffraction patterns, EDX mapping, and CL spectrum analysis.
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Zeiss UltraPlus SEM
UltraPlus
Zeiss
Energy dispersive X-ray spectrometry (EDX) measurements
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Zeiss MERLIN SEM
MERLIN
Zeiss
Cathodoluminescence (CL) measurements
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Zyla 5.5 sCMOS camera
5.5
Andor
Camera for CL measurements
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Panalytical X'Pert Pro MPD diffractometer
Panalytical
X-ray diffraction (XRD) analysis for structural characterization
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TEM Libra 200 microscope
Libra 200
Bright field TEM imaging and electron diffraction patterns acquisition
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SPARC system
Delmic
Cathodoluminescence (CL) measurements
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Kymera 193i spectrograph
193i
Spectrograph for CL measurements
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