研究目的
Investigating the synchronous enhancement for responsivity and response speed in In2Se3 photodetector modulated by piezoresistive effect.
研究成果
The study demonstrates that mechanical strain can significantly enhance the responsivity and response speed of In2Se3-based photodetectors through the piezoresistive effect. This strategy provides a promising route for the development of high-performance optoelectronic devices.
研究不足
The study focuses on the In2Se3-based photodetectors and the effects of mechanical strain on their performance. The applicability of the findings to other materials or under different conditions is not explored.
1:Experimental Design and Method Selection:
The study involved the fabrication of In2Se3-based photodetectors on flexible PET substrates and the application of mechanical strain to modulate their photodetection performance. The piezoresistive effect was utilized to modulate the band structure of In2Se3 semiconductor and the Schottky barrier at the interface between Au and In2Se
2:Sample Selection and Data Sources:
2D In2Se3 films were synthesized onto mica substrates by chemical vapor deposition (CVD) method.
3:List of Experimental Equipment and Materials:
Instruments used include SEM (Hitachi S-4200), TEM (Tacnai-G2 F30), Raman spectroscopy (LabRAM XploRA), UV?VIS spectrophotometer (Hitachi U-4100), AFM (Bruker Dimension Icon), XRD (DIFFRACTOMETER-6000), and a program-controlled semiconductor characterization system (Keithley 4200-PA SCS).
4:Experimental Procedures and Operational Workflow:
The photoelectric properties of the In2Se3-based photodetectors were measured under various strain conditions. The response speed was measured using a nanosecond pulsed laser and an oscilloscope.
5:Data Analysis Methods:
The responsivity and response speed were analyzed under different strain conditions to evaluate the performance enhancement.
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SEM
Hitachi S-4200
Hitachi
Characterization of the chemical configurations of the samples.
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UV?VIS spectrophotometer
Hitachi U-4100
Hitachi
Exploring the optical absorption properties of In2Se3.
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AFM
Bruker Dimension Icon
Bruker
Determination of the thickness of In2Se3.
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Semiconductor characterization system
Keithley 4200-PA SCS
Keithley
Measurement of the electrical and optoelectronic performances.
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TEM
Tacnai-G2 F30
Identification of the structure of samples.
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Raman spectroscopy
LabRAM XploRA
Recording Raman spectra of the samples.
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XRD
DIFFRACTOMETER-6000
Identification of the structural characteristics of In2Se3.
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Oscilloscope
3104T
Examination of the photoresponse.
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Triaxial strain testing platform
SGM7J
Application of mechanical strain.
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