研究目的
Investigating the effect of solvent annealing on grain growth to enhance the efficiency of photovoltaic devices with 2D perovskite films based on (BA)2(MA)3pb4i13 prepared by single-source thermal evaporation.
研究成果
Solvent annealing effectively enhances the crystallization of (BA)2(MA)3pb4i13 thin films, leading to denser and larger crystal grains, a favorable band gap, and improved photovoltaic performance. The method shows promise for preparing large-area and efficient 2D perovskite solar cells.
研究不足
The study is limited to the specific 2D perovskite material (BA)2(MA)3pb4i13 and the solvent annealing process with γ-butyrolactone. The efficiency range of the solar cells, while improved, still has room for optimization.
1:Experimental Design and Method Selection:
The study focused on the preparation of (BA)2(MA)3pb4i13 thin films by single-source thermal evaporation and the investigation of solvent annealing effects on their microstructural and optoelectronic properties.
2:Sample Selection and Data Sources:
(BA)2(MA)3pb4i13 crystals and powders were prepared from PbI2, MAI, and BAI mixed in γ-butyrolactone.
3:List of Experimental Equipment and Materials:
X-ray diffractometer, energy-dispersive X-ray microanalysis system, scanning electron microscope, time-resolved PL equipment, UV/visible/near-IR spectrophotometer, and Keithley 2400 Source Measure Unit.
4:Experimental Procedures and Operational Workflow:
The thin films were prepared by single-source thermal evaporation and then subjected to solvent annealing under γ-butyrolactone atmosphere.
5:Data Analysis Methods:
The crystalline structure, composition, surface morphology, optical properties, and photovoltaic performance of the thin films were analyzed.
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Energy-dispersive X-ray microanalysis system
QUANTAX 200
Bruker
Analyzing the composition and surface morphology of perovskite film and powder
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Time-resolved PL equipment
Fluo Time 300
Pico Quant GmbH
Recording the time-resolved PL
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UV/visible/near-IR spectrophotometer
Lambda 950
PerkinElmer
Obtaining the optical transmittance properties
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X-ray diffractometer
Ultima IV
Analyzing the crystalline structure of the (BA)2(MA)3pb4i13 thin films and powder
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Scanning electron microscope
SUPRA 55
Analyzing the surface morphology of perovskite film and powder
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Source Measure Unit
Keithley 2400
Recording the J-V curves of the 2D perovskite solar cells
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