研究目的
Investigating the growth of a transferable GaN epilayer on an improved AlN/graphene composite substrate for high-brightness violet light-emitting diodes (LEDs).
研究成果
The study successfully demonstrated the growth of high-quality GaN epilayers on AlN/graphene composite substrates, enabling the fabrication of high-brightness violet LEDs. The method also allows for the mechanical transfer of GaN films, opening possibilities for flexible LED lighting applications.
研究不足
The study focuses on the growth and characterization of GaN epilayers and LEDs on AlN/graphene composite substrates. Potential limitations include the scalability of the transfer process and the uniformity of the graphene layer over large areas.
1:Experimental Design and Method Selection:
The study involves theoretical calculations using first-principles calculations based on density functional theory to examine the formation mechanism of AlN on graphene. An AlN composite nucleation layer is inserted between graphene and GaN, grown by metal organic chemical vapor deposition (MOCVD) using a time-distributed and constant-pressure growth method.
2:Sample Selection and Data Sources:
Large-area graphene was synthesized via CVD on Cu foils and transferred to sapphire substrates. GaN and LED structures were grown on the graphene/sapphire substrates.
3:List of Experimental Equipment and Materials:
Equipment includes MOCVD for GaN growth, ellipsometer for thickness measurement, SEM, AFM, Raman spectroscopy, and PL measurements for characterization.
4:Experimental Procedures and Operational Workflow:
The growth process of AlN was divided into three stages with varying V/III ratios to manufacture defects, promote horizontal merging of nucleation islands, and accelerate the growth rate of the AlN film. GaN and LED structures were then grown on the AlN/graphene composite substrate.
5:Data Analysis Methods:
Characterization techniques included SEM, AFM, Raman spectroscopy, and PL measurements to analyze the quality and properties of the grown layers and LED structures.
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M-2000 D Auto Angle Ellipsometer
M-2000 D
J.A.Woollam Co., Inc.
Measuring the thickness of AlN
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SEM
FEI Quanta 600 FEG
FEI
Characterization of the as-grown GaN epilayer
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AFM
BRUKER
BRUKER
Characterization of the as-grown GaN epilayer
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FIB
FEI Helios G4 CX
FEI
Fabrication of the cross-TEM sample
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STEM
FEI Talos F200X
FEI
Obtaining STEM images
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Raman spectroscopy
Horiba JY, LabRam HR 800
Horiba
Characterization of the as-grown GaN epilayer
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PL measurements
Jobin Yvon LavRam HR800
Jobin Yvon
Characterization of the as-grown GaN epilayer
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X-ray rocking curves
X’pert MRD XL
Obtaining X-ray rocking curves
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