研究目的
Investigating the use of solution-processable two-dimension α-In2Se3 as an efficient hole transport layer for high-performance and stable polymer solar cells.
研究成果
The study demonstrates that solution-processable α-In2Se3 is a promising candidate as an efficient and stable hole extraction layer in polymer solar cells, achieving comparable performance to PEDOT:PSS-based devices with enhanced thermal and long-term stability.
研究不足
The study focuses on the initial application of α-In2Se3 as HTL in PSCs, with potential areas for optimization in device fabrication and material processing.
1:Experimental Design and Method Selection:
The study employs liquid phase exfoliation method to fabricate α-In2Se3 nanosheets and investigates their photoelectric properties.
2:Sample Selection and Data Sources:
Bulk α-In2Se3 is used as the starting material, and the resulting nanosheets are characterized using various techniques.
3:List of Experimental Equipment and Materials:
Includes instruments like sonicator, centrifuge, spin coater, and materials like PBDB-T, ITIC, and PEDOT:PSS.
4:Experimental Procedures and Operational Workflow:
Detailed steps for preparing α-In2Se3 solution, fabricating devices, and characterizing their performance.
5:Data Analysis Methods:
Techniques like XRD, SEM, Raman spectroscopy, and AFM are used for analysis.
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RigakuD/max2500v/Pc
D/max2500v/Pc
Rigaku
Used for X-ray diffraction (XRD) measurements.
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Bruker Multi Mode 8 scanning probe microscope
Multi Mode 8
Bruker
Used for Atomic force microscope (AFM) imaging.
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Keithley 2400 source
2400
Keithley
Used for current density versus voltage (J-V) characteristics measurement.
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KQ-100TDB sonicator
KQ-100TDB
Not specified
Used for sonication in the preparation of α-In2Se3 solution.
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TGL-16C centrifuge
TGL-16C
Not specified
Used for centrifugation in the preparation of α-In2Se3 solution.
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GeminiSEM 500
GeminiSEM 500
Not specified
Used for Scanning electron microscope (SEM) characterization.
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Renishaw Invia Raman microscope
Invia
Renishaw
Used for Raman spectra recording.
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JEM-2100F
JEM-2100F
Not specified
Used for Transmission electron microscopy (TEM) imaging.
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KP Technology SKP5050
SKP5050
KP Technology
Used for Scanning Kelvin probe microscopy.
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HP 8453
8453
HP
Used for UV-vis transmission spectra measurement.
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Enlitech, QE-R
QE-R
Enlitech
Used for external quantum efficiency (EQE) spectra testing.
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