研究目的
Investigating the electrical conductivity-induced Sb2Se3-based photovoltaic performance improvement.
研究成果
The research demonstrated an effective strategy for improving Sb2Se3-based photovoltaic performance through electrical conductivity enhancement. A novel Sb2Se3 quasi-homojunction thin film solar cell was fabricated with a power conversion efficiency of 2.65%, showing great potential for thin film photovoltaic applications.
研究不足
The demonstrated power conversion efficiency is still far from the theoretical predictions, and the research on Sb2Se3 quasi-homojunction thin film solar cells has just started.
1:Experimental Design and Method Selection:
High-temperature melting technique for preparing Sb2Se3-based targets and RF magnetron sputtering for thin film deposition.
2:Sample Selection and Data Sources:
Sb2Se3, Sb2Se
3:3, and Sb2(Se9I1)3 targets prepared from high purity antimony, selenium, and iodine. List of Experimental Equipment and Materials:
Plassys MP600S sputtering equipment, PANalytical's X-ray diffractometer, JEOL JSM-7100 F SEM, PerkinElmer LAMBDA 1050 UV/Vis/NIR spectrophotometer, Semilab PN tester PN-100, Autolab Metrohm potentiostat, Keithley 2400 Series multimeter.
4:Experimental Procedures and Operational Workflow:
Preparation of Sb2Se3-based targets, deposition of thin films via RF magnetron sputtering, characterization of thin films and solar cells.
5:Data Analysis Methods:
XRD for phase identification, SEM for morphology, UV/Vis/NIR for optical properties, PEC measurements for photoelectric performance.
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Semilab PN tester PN-100
PN-100
Semilab
Determination of thin film conductivity type
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Keithley 2400 Series multimeter
2400 Series
Keithley
Characterization of photovoltaic devices
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JEOL JSM-7100 F thermal field emission scanning electron microscope
JSM-7100 F
JEOL
Morphology analysis of thin films
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PerkinElmer LAMBDA 1050 UV/Vis/NIR spectrophotometer
LAMBDA 1050
PerkinElmer
Optical reflectance and transmittance investigation
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Plassys MP600S sputtering equipment
MP600S
Plassys
Deposition of thin films via RF magnetron sputtering
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PANalytical's X-ray diffractometer
PANalytical
X-ray diffraction analysis
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Autolab Metrohm potentiostat
Autolab Metrohm
Recording current-voltage characteristics
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