研究目的
Investigating the influence of single-walled carbon nanotubes (SWCNTs) on the exciton dissociation improvement in hybrid organic photovoltaic devices.
研究成果
The integration of SWCNTs into P3HT:PCBM polymer/fullerene based hybrid organic photovoltaic devices enhances both the device short-circuit current and fill factor, resulting in a significant improvement in the photoconversion efficiency. This enhancement is attributed to an improvement in the excitons' dissociation efficiency at the SWCNT/polymer interface and to the faster electron transfer through the incorporated nanotubes' percolation paths.
研究不足
The study is limited by the potential for short-circuit effects at higher SWCNT concentrations and the challenges in dispersing high loads of carbon nanotubes into the polymer matrix. Additionally, the TOF-SIMS profiles were not calibrated to provide concentration instead of intensities due to the lack of specific certified standard samples.
1:Experimental Design and Method Selection:
Integration of SWCNTs with P3HT and PCBM as a hybrid photoactive layer for bulk heterojunction solar cell devices. Use of time-of-flight secondary ion mass spectrometry for molecular information.
2:Sample Selection and Data Sources:
Use of torch-plasma-grown SWCNTs, regioregular P3HT, and PCBM.
3:List of Experimental Equipment and Materials:
Jeol JEM-2100 F FEG-TEM microscope, Digital Instruments AFM, Jeol-JSM-6300F SEM, Renishaw Imaging Microscope Wire for micro Raman spectroscopy, Escalab 220i-XL system for XPS, IONTOF TOF-SIMS5 for depth profiling, HMS-5000 system for Hall measurements, Specord? 210 plus UV-Vis spectrophotometer, HP4155C semiconductor parameter analyzer, TELTEC solar simulator.
4:Experimental Procedures and Operational Workflow:
Fabrication of photovoltaic devices with different SWCNT concentrations, characterization of optical and electrical properties, measurement of photovoltaic performance under AM
5:5 illumination. Data Analysis Methods:
Analysis of photovoltaic parameters (Jsc, VOC, FF, PCE), Hall mobility measurements, optical absorption and photoluminescence spectroscopy.
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Jeol JEM-2100 F FEG-TEM
JEM-2100 F
Jeol
Bright field transmission electron microscopy
-
Jeol-JSM-6300F SEM
JSM-6300F
Jeol
Scanning electron microscopy with EDS
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HP4155C
4155C
Agilent Technologies
Semiconductor parameter analyzer
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HR 4000
HR 4000
Ocean Optics
Integrated optical spectrometer
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Digital Instruments AFM
NanoScope III
Digital Instruments
Atomic force microscopy
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Renishaw Imaging Microscope Wire
Renishaw
Micro Raman spectroscopy
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Escalab 220i-XL system
220i-XL
VG instruments
X-ray photoelectron spectroscopy
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IONTOF TOF-SIMS5
TOF-SIMS5
IONTOF
Depth profiling
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HMS-5000 system
HMS-5000
Hall measurements
-
Specord? 210 plus
210 plus
Germany
UV-Vis spectrophotometer
-
TELTEC
Solar simulator
-
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