研究目的
To determine the influences of the deposition pressure on the structural and the optical properties of ZnMnO films grown by PLD.
研究成果
Zn0.95Mn0.05O thin films exhibited a wurtzite crystal structure under different oxygen growth pressures, with Mn2+ ions located in the Zn2+ structure without other crystallographic phases. Optical properties confirmed high quality crystallographic orientation. Band gap values suggested sp–d exchange interaction in the doped material. AFM results indicated improved roughness with increased pressure, but no direct relation was found between gas pressure variation and optical/crystallographic properties.
研究不足
The study did not find a direct relation between the variation of the gas pressure and the optical and crystallographic properties, suggesting that magnetic properties might be a key factor due to possible generation of oxygen vacancies and changes in interactions between Mn atoms in the structure.
1：Experimental Design and Method Selection:
Pulsed laser deposition (PLD) was used to synthesize Mn-doped ZnO thin films on Si(100) substrates under varying oxygen gas pressures, with constant substrate temperature and Mn concentration.
2：Sample Selection and Data Sources:
Six Mn-doped ZnO thin films were prepared, with oxygen gas pressure varied while keeping other parameters constant.
3：List of Experimental Equipment and Materials:
A pulsed Nd:YAG laser (1064 nm wavelength, 100 mJ, 9 ns pulse duration and 10 Hz), Bruker D8 advanced diffractometer, Jobin-Yvon micro-Raman spectrometer, NT-MDT SMENA Solver-PRO AFM, Perkin Elmer Lambda 9 UV/VIS/NIR spectrometer.
4：Experimental Procedures and Operational Workflow:
Films were characterized using XRD, AFM, Raman spectroscopy, and UV-Vis spectroscopy to analyze structural and optical properties.
5：Data Analysis Methods:
XRD patterns were analyzed for crystalline structure, AFM for surface morphology, Raman spectroscopy for vibrational modes, and UV-Vis for band gap evaluation.
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