研究目的

To present a method to precisely determine the quantum efficiency and primary photocurrent in avalanche photodiodes (APDs) based on a linear relationship between excess noise factor F and gain, M, and to compare performance of modern APD designs when nonlocal impact ionization effects govern the relationship between noise and gain.

研究成果

The new method provides a more accurate determination of quantum efficiency, gain, and excess noise in APDs, especially those with significant non-local impact ionization effects. It avoids the need for assumptions regarding layer thicknesses and optical properties, offering a better figure of merit for comparing noise performances of different APDs.

研究不足

The method is particularly suited to APDs with a substantial non-local effect in the multiplication layer. Some APDs may not follow the linear relationship between excess noise factor and gain, indicating potential limitations in applicability to all APD designs.