研究目的
Investigating the structural and spectroscopic properties of Yb3+-doped and undoped MoS2 thin films for optoelectronic and photonic device applications.
研究成果
The research provides fundamental insights into the nonlinear optical response of Yb3+-doped and undoped MoS2 films, highlighting their potential for applications in nano-scale photonic devices such as passive mode locking and optical switching. The comparative analysis of fs-PLD and liquid-phase epitaxy grown films offers a platform for future materials fabrication in optoelectronic and photonic device engineering.
研究不足
The study is limited by the computational intensity of the hybrid functional (HSE06) code used for band gap prediction and the potential for underestimation of band gaps by DFT.
1：Experimental Design and Method Selection:
The study involves the fabrication of undoped and Yb3+-ion doped MoS2 thin films using femto-second pulsed laser deposition (fs-PLD) and compares their structural and spectroscopic properties with liquid-phase epitaxy grown undoped MoS2 films.
2：Sample Selection and Data Sources:
The structural characterizations were analyzed using Raman, FTIR, UV-visible, and X-ray photoelectron spectroscopic, atomic force and transmission electron microscopic techniques.
3：List of Experimental Equipment and Materials:
Equipment includes fs-PLD for film fabrication, Raman spectrometer, FTIR spectrometer, UV-visible spectrometer, X-ray photoelectron spectrometer, atomic force microscope, and transmission electron microscope.
4：Experimental Procedures and Operational Workflow:
The electronic structure of MoS2 was analyzed through first principles calculations using density functional theory (DFT) with CASTEP code, employing a hybrid functional (HSE06) for accurate band gap prediction.
5：Data Analysis Methods:
The nonlinear optical properties were investigated using open aperture Z-scan technique with a 532 nm laser source.
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Raman spectrometer
Structural characterization of MoS2 thin films
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FTIR spectrometer
Structural characterization of MoS2 thin films
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UV-visible spectrometer
Structural characterization of MoS2 thin films
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X-ray photoelectron spectrometer
Structural characterization of MoS2 thin films
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Atomic force microscope
Structural characterization of MoS2 thin films
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Transmission electron microscope
Structural characterization of MoS2 thin films
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CASTEP code
Electronic structure analysis of MoS2
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532 nm laser source
frequency doubled YAG
Nonlinear optical properties investigation
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