研究目的
Investigating the electrophoretic deposition (EPD) of graphene quantum dots (GQDs) thin films on transparent substrates without the use of dispersion additives, and studying the effects of applied voltage and deposition time on the film's morphology and physico-optical properties.
研究成果
The study successfully demonstrated the additive-free electrophoretic deposition of GQDs thin films on ITO substrates, achieving optimal surface morphology at 30 V in 5 min. The films exhibited excellent physico-optical properties, including high visible transparency and double-peak photoluminescence, making them promising for applications like transparent conductors and smart windows.
研究不足
The study is limited to the electrophoretic deposition of GQDs on ITO substrates without exploring other substrates or deposition methods. The impact of environmental conditions on the deposition process was not investigated.
1:Experimental Design and Method Selection:
The study utilized electrophoretic deposition (EPD) to fabricate GQDs thin films on ITO substrates without additives, varying applied voltage (10-50 V) and deposition time (5-25 min).
2:Sample Selection and Data Sources:
GQDs were synthesized by pyrolysis of citric acid and dispersed in ethanol for EPD. ITO glass was used as the substrate.
3:List of Experimental Equipment and Materials:
Included a DC power supply for EPD, ITO substrates, ethanol for dispersion, and various characterization tools like HRTEM, AFM, XPS, UV-Vis spectrophotometer, and PL spectrofluorometer.
4:Experimental Procedures and Operational Workflow:
GQDs were synthesized, dispersed in ethanol, and deposited onto ITO substrates via EPD under varying conditions. The films were then characterized for morphology, chemistry, and optical properties.
5:Data Analysis Methods:
The study analyzed the films' surface morphology, chemistry, and optical properties using techniques like AFM for surface roughness, XPS for chemical composition, and UV-Vis and PL for optical properties.
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High-resolution transmission electron microscope
JEOL 2010
JEOL
Characterization of GQDs geometrical features in dispersion.
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Zeta Potential-Zetasizer
Malvern ZS
Malvern
Determination of GQDs suspension stability.
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Extreme high-resolution scanning electron microscope
FEI MagellanTM 400L
FEI
Measurement of surface morphology and deposited thickness of GQDs thin film.
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Fourier-transform infrared spectrophotometer
Perkin Elmer Frontier
Perkin Elmer
Measurement of FTIR spectra of as-fabricated GQDs thin films.
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X-ray photoelectron spectrometer
Kratos AXIS Supra
Kratos
Characterization of surface chemistry of GQDs thin films.
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DC power supply
Mini 300
Major Science
Used for electrophoretic deposition (EPD) process to apply varying voltages.
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Focus ion beam-SEM
FIB-460F1 Dual Beam
Measurement of deposited thickness of GQDs thin film.
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Microanalytical balance
XP26
Mettler Toledo
Estimation of GQDs deposition amount by measuring the weight of ITO substrate before and after EPD.
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Atomic force microscope
Asylum Research Cypher S
Characterization of surface roughness of GQDs thin films.
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UV-Vis-NIR spectrophotometer
Cary 500
Measurement of ultraviolet-visible (UV-Vis) spectra.
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Spectrofluorometer
Cary Eclipse
Measurement of photoluminescence (PL) of GQDs thin films.
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