研究目的
To explore the growth and optical properties of the Pr(BO2)3 crystal, a new stoichiometric laser crystal, and to evaluate its potential for laser applications.
研究成果
The Pr(BO2)3 crystal exhibits promising optical properties for laser applications, including a large absorption cross section and FWHM, and a significant emission cross section at 650 nm. Its physical properties, such as thermal and chemical stability, hardness, and cleavage properties, were characterized, indicating potential for thin-layer detectors and laser applications.
研究不足
The study is limited by the crystal's cleavage properties and the need for further optimization of growth conditions to improve crystal quality and size.
1:Experimental Design and Method Selection:
The Pr(BO2)3 crystal was grown by a flux method using 3Li2CO3-2H3BO3 flux. The absorption spectrum, emission spectrum, and luminescence lifetime were measured.
2:Sample Selection and Data Sources:
Polycrystalline Pr(BO2)3 was synthesized by the high-temperature solid-state reaction.
3:List of Experimental Equipment and Materials:
Bruker AXS D8 Advance X-ray diffractometer, Field Emission Scanning Electron Microscopy (FESEM, Hitachi S-4800), Perkin Elmer Diamond TG/DTA simultaneous thermal analyzer, Raman spectrometer (JY, LabRAM HR 800), Hitachi U-3500 UV–vis–NIR spectrometer, TRIAX550 spectrophotometer, Edinburgh Instruments FLS920 spectrophotometer.
4:Experimental Procedures and Operational Workflow:
The crystal growth involved melting and superheating raw materials in a platinum crucible, followed by slow cooling. Physical and optical properties were characterized.
5:Data Analysis Methods:
Judd–Ofelt theory was used to calculate spectrum parameters. First-principles calculations were performed to investigate the electronic structure and optical properties.
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Perkin Elmer Diamond TG/DTA simultaneous thermal analyzer
Diamond TG/DTA
Perkin Elmer
Thermo-gravimetric (TG) and differential thermal (DTA) analysis
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Raman spectrometer
LabRAM HR 800
JY
Raman spectrum measurement
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UV–vis–NIR spectrometer
U-3500
Hitachi
Absorption spectrum measurement
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FLS920 spectrophotometer
FLS920
Edinburgh Instruments
Luminescence decay measurement
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Field Emission Scanning Electron Microscopy
S-4800
Hitachi
Sample morphology examination
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Bruker AXS D8 Advance X-ray diffractometer
D8 Advance
Bruker AXS
Powder X-ray diffraction data collection
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TRIAX550 spectrophotometer
TRIAX550
Fluorescence spectrum collection
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microhardness-tester
HX-1000TM
Taiming
Mechanical hardness estimation
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