研究目的
Investigating the effectiveness of spray-coated SnO2 films as electron transport layers (ETLs) for perovskite solar cells (PSCs) to achieve high efficiency and stability with low material consumption.
研究成果
The spray-coated SnO2 films serve as effective ETLs for PSCs, achieving comparable efficiency to spin-coated films with the advantages of lower material consumption and suitability for large-scale production. This method presents a promising approach for the commercial fabrication of PSCs.
研究不足
The study focuses on the comparison between spray-coated and spin-coated SnO2 films without exploring other potential ETL materials or methods. The impact of environmental conditions on spray coating was not extensively studied.
1：Experimental Design and Method Selection:
The study introduces a spray coating method for preparing SnO2 films as ETLs for PSCs, comparing its performance with conventional spin-coated SnO2 films.
2：Sample Selection and Data Sources:
SnO2 hydrocolloid was used as the precursor for both spray and spin coating methods. Perovskite materials and other chemicals were purchased from specified suppliers.
3：List of Experimental Equipment and Materials:
SEM (Hitachi SU8000), AFM (Bruker instrument), Dektak XT for thickness analysis, XRD (Brucker D8), source meter (Keithley 2400), and EQE measurement setup were used.
4：Experimental Procedures and Operational Workflow:
SnO2 films were prepared by spray and spin coating, followed by the fabrication of PSCs with the structure ITO/SnO2/perovskite/Spiro-OMeTAD/Ag. The performance of these devices was then evaluated.
5：Data Analysis Methods:
The morphology of SnO2 films was analyzed using SEM and AFM. The performance of PSCs was evaluated through J-V characteristics and EQE measurements.
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SEM
Hitachi SU8000
Hitachi
Observing the morphologies of SnO2 films and perovskite films
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AFM
Bruker instrument
Bruker
Analyzing the surface morphologies of SnO2 films
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XRD
Brucker D8 X-ray diffractometer
Brucker
Recording the X-ray diffraction patterns of samples
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Source meter
Keithley 2400
Keithley
Measuring the current density-voltage characteristics of solar cells
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Dektak XT
Analyzing the thickness of SnO2 films
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Reference monocrystalline silicon solar cell
91150 V Oriel Instruments
Oriel Instruments
Calibrating the simulated one sun illumination
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EQE measurement setup
Crowntech QTest Station 1000AD
Crowntech
Measuring the external quantum efficiency spectra
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