研究目的

To present a method to precisely determine the quantum efficiency and primary photocurrent in avalanche photodiodes (APDs) based on a linear relationship between excess noise factor F and gain, M, and to accurately compare performance of modern APD designs when nonlocal impact ionization effects govern the relationship between noise and gain.

研究成果

The new method provides a more accurate way to determine the quantum efficiency, gain, and excess noise of APDs based primarily on the measured parameters of noise, photocurrent and input optical power, without relying on assumptions regarding layer thicknesses, absorption coefficients or optical transmissions and reflections through anti-reflective coatings and mirrors.

研究不足

The method is particularly suited to the analysis of APDs with a substantial non-local effect in the multiplication layer. Some APDs presented in the literature do not appear to follow the equation (4) relationship, despite having what should be appreciable non-local effects in the multiplication layer.