研究目的
Presenting a practical alternative for soft defect localization (SDL) and fault isolation of dynamic failures in microcontrollers using existing OBIRCH hardware without a DLS add-on kit and code modification.
研究成果
The presented practical DLS technique is effective for localizing soft defects in microcontroller self-test failures, offering a simpler, economical, and efficient alternative to conventional methods. It significantly reduces turnaround time for failure analysis cases involving resistive interconnect defects.
研究不足
The technique requires thorough electrical sample preparation and code modification, which may not be feasible for all types of dynamic failures. The effectiveness is dependent on the ability to minimize the self-test code to vital instructions.
1：Experimental Design and Method Selection:
Utilizes existing OBIRCH hardware for dynamic failure analysis without the need for a DLS add-on kit. Involves code modification to minimize self-test code to vital instructions.
2：Sample Selection and Data Sources:
Microcontroller units failing self-tests under specific conditions were selected. Data was acquired through ATE testing and debugging of self-test assembly code.
3：List of Experimental Equipment and Materials:
HAMAMATSU PHEMOS 1000 laser stimulation system, OBIRCH DLS diode-resistor network, clock source, variable power supply, programmer/debugger.
4：Experimental Procedures and Operational Workflow:
Characterization of failing self-test, identification of P/F trigger point, self-test code modification, and practical DLS with minimized code.
5：Data Analysis Methods:
Analysis of OBIRCH signals and emission microscopy to localize defect sites.
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