研究目的
Investigating the formation and properties of flexible nano-organic films of 2,7,12,17-tetra-tert-butyl-5,10,15,20-tetraaza-21H,23H-porphine (TTBTP) for optoelectronic applications.
研究成果
TTBTP films prepared by thermal evaporation exhibit promising properties for optoelectronic applications, including a nano-size structure, semiconductor behavior, and broad UV-VIS absorption. The films have two conduction mechanisms with distinct activation energies, suggesting potential use in organic photovoltaic devices.
研究不足
The study is limited to the characterization of TTBTP films prepared by thermal evaporation. The potential effects of other deposition methods or conditions on the film properties were not explored.
1：Experimental Design and Method Selection:
The TTBTP film was prepared using a thermal evaporation technique under high-vacuum conditions.
2：Sample Selection and Data Sources:
TTBTP powder was purchased from Sigma-Aldrich Company.
3：List of Experimental Equipment and Materials:
A high-vacuum coating system (Auto HHV306), FTIR spectrometer (Bruker Vector 22), SEM (JOEL scan system), X-ray diffractometer (Philip’s diffractometer 1710), UV-VIS spectrophotometer (Jenway, Model 6800, UK), and Keithley model 610 for electrical resistance measurement.
4：Experimental Procedures and Operational Workflow:
The film was deposited on polyacetate flexible substrates with a thickness of 150 nm. The molecular structure, surface morphology, crystal structure, optical, and electrical properties were analyzed.
5：Data Analysis Methods:
The crystallite size was calculated using Scherrer’s equation. The optical absorption coefficient and energy gaps were determined from the absorbance spectrum. Electrical conductivity was calculated from resistance measurements.
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FTIR spectrometer
Bruker Vector 22
Bruker
Used to obtain FTIR spectra of TTBTP powder and films.
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SEM
JOEL scan system
JOEL
Used to examine the surface morphology of TTBTP films.
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Electrical resistance measurement device
Keithley model 610
Keithley
Used for measuring the electrical resistance of TTBTP films.
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TTBTP powder
Sigma-Aldrich
Used as the primary material for film preparation.
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Polyacetate sheets
Sigma-Aldrich
Used as flexible substrates for film deposition.
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High-vacuum coating system
Auto HHV306
Used for the thermal evaporation of TTBTP films.
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X-ray diffractometer
Philip’s diffractometer 1710
Philip’s
Used for crystal structural analysis of TTBTP films.
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UV-VIS spectrophotometer
Jenway, Model 6800
Jenway
Used to measure the absorbance of TTBTP films.
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