研究目的
To fabricate a lead-free Cs3Bi2Br9 perovskite photodetector (PD) and build a prototype of this perovskite PD-based imaging system with diffuse reflection imaging mode, addressing the issues of toxicity from lead-based perovskites and large light current fluctuations.
研究成果
The ALD-optimized Cs3Bi2Br9 PD has addressed two major concerns about perovskite PDs-based imaging devices: toxicity from lead-based perovskites and large light current fluctuations. This may extend the application of perovskite materials and improve imaging quality. The proposed parameter F related to light current fluctuation is proven to be effective in evaluating the imaging performance of PDs.
研究不足
The study focuses on the fabrication and optimization of Cs3Bi2Br9 perovskite PDs and their application in diffuse reflection imaging. However, the practical application of these PDs in commercial imaging devices may still face challenges such as long imaging times and the need for further optimization of the imaging system.
1：Experimental Design and Method Selection:
The study involves the fabrication of Cs3Bi2Br9 perovskite films with and without ALD-TiO2 layer to compare their performance. The ALD technique is used to optimize the perovskite film quality.
2：Sample Selection and Data Sources:
Cs3Bi2Br9 perovskite films are prepared on ALD-TiO2/FTO or bare FTO glass. The precursor solution for Cs3Bi2Br9 is synthesized by dissolving a mixture solution of CsBr:BiBr3 in dimethyl sulfoxide (DMSO).
3：List of Experimental Equipment and Materials:
Equipment includes X-Ray diffraction (XRD) technique (Rigaku, Miniflex600), UV-vis spectrophotometer (SHIMADZU, UV-2600), and scanning electron microscope (SEM, ZEISS ULTRA 55). Materials include CsBr, BiBr3, DMSO, and ALD-TiO
4：5). Materials include CsBr, BiBr3, DMSO, and ALD-TiOExperimental Procedures and Operational Workflow:
2. 4. Experimental Procedures and Operational Workflow: The Cs3Bi2Br9 perovskite films are prepared by spin-coating at 4000 r/min. The TiO2 coating layer is deposited on the FTO glass by ALD technique. The structure and properties of the films are characterized by XRD, UV-vis spectrophotometer, and SEM.
5：Data Analysis Methods:
The performance of the PDs is evaluated by measuring light current and dark current intensities, I-V curves, and time-dependent photocurrent (I-t) curves. The new parameter F related to light current fluctuation is proposed and calculated to evaluate imaging performance.
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Scanning electron microscope
ULTRA 55
ZEISS
Obtaining images of the perovskite films
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Keithley source meter
2601A
Keithley
Measurement of voltage-dependent photocurrent (I-V) curves and photoresponse curves
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Electric sliding tables
TSA50-C
Zolix
Displacement platform for the imaging system
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Two-phase stepper motor controller with motor drive
SC300-2B
Zolix
Control of the displacement platform
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Source meter
2601B
Keithley
Data collector for the imaging system
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X-Ray diffraction
Miniflex600
Rigaku
Characterization of the structure of Cs3Bi2Br9 perovskite films
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UV-vis spectrophotometer
UV-2600
SHIMADZU
Measurement of the absorption spectrum of the thin film
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QE-R external quantum efficiency instrument
Si detector S10-14 010
Enlitech
Measurement of the spectral response curve
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405-nm laser
LE-LS-405-80TSM-HM
LEO
Light source for the imaging system
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