研究目的
Investigating the fabrication of vertically aligned Sb2S3 thin film solar cells using vapor transport deposition (VTD) method to enhance carrier transport and solar cell performance.
研究成果
The VTD method allows the generation of a sulfur deficiency at the surface of CdS buffer layer, providing a preferred bonding between S from the Sb2S3 ribbons and Cd2+ from CdS buffer layer, forming the vertical orientated Sb2S3 grains. This method improves the overall performance of the Sb2S3 solar cell considerably by simply adjusting the Sb2S3 grain orientation.
研究不足
The roughness is relatively high for the VTD deposited Sb2S3 film, and its direct contact with gold electrode is not yet an ideal ohmic contact which together limited the fill factor (FF) of our configuration.
1：Experimental Design and Method Selection:
The study adopted a vapor transport deposition (VTD) method to fabricate vertically aligned Sb2S3 on a CdS buffer layer, comparing it with the rapid thermal evaporation (RTE) method.
2：Sample Selection and Data Sources:
Sb2S3 films were deposited on CdS coated ITO glass by both VTD and RTE methods.
3：List of Experimental Equipment and Materials:
Equipment included a dual zones tube furnace for VTD, RTP furnace for RTE, and characterization tools like SEM, TEM, XRD, XPS, etc.
4：Experimental Procedures and Operational Workflow:
Detailed procedures for both VTD and RTE methods were followed, including pre-treatment of CdS buffer layer, deposition conditions, and post-deposition treatments.
5：Data Analysis Methods:
Performance of solar cells was analyzed using J-V curves, EQE spectra, CV and DLCP profiling, TR-PL decay curves, and PL spectra.
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transmission electron microscopy
JEM-F200
JEOL
Study of morphologies of Sb2S3 film
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source meter
2400
Keithley
Measurement of current density?voltage (J?V) curves
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time-correlated single photon counting
Microtime200
Picoquant
Time-resolved photoluminescence (TR-PL) characterization
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scanning electron microscopy
Nova NanoSEM450
FEI
Study of morphologies of Sb2S3 film
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MTI Furnace OTF-1200
OTF-1200
MTI
Dual zones tube furnace for vapor transport deposition
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X-ray Diffraction
X pert pro MRD
Philips
Investigation of crystal structure of Sb2S3 film
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X-ray photoelectron spectroscopy
Genesis
EDAX Inc.
Analysis of the chemical nature of Sb2S3
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transmission electron microscopy
CM200
Philips
Study of morphologies of Sb2S3 film
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Time-of-Flight Secondary Ion Mass Spectrometer
TOF-SIMS5
ION-TOF GmbH Münster Germany
Analysis of element distribution
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solar simulator
PV Measurements
Measurement of current density?voltage (J?V) curves
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spectral response system
QEX10
PV measurements, Inc.
Collection of EQE data
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impedance analyser
Capacitance?voltage (C?V) and Drive-Level Capacitance Profiling (DLCP) measurement
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solid-state laser
Excitation source for TR-PL characterization
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picosecond tuneable diode pumped laser
PT259-SH-A0-H-2H
Ekspla
Pump for photoluminescence measurements
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optical fibre
Collection of photoluminescence in reflection mode
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Si spectrometer
Glacier X TE cooled
BWTEK
Measurement of photoluminescence spectra
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InGaAs spectrometer
Sol 1.7 TE cooled
BWTEK
Measurement of photoluminescence spectra
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QTH lamp
225 W
Excitation source for PDS measurement
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monochromator
CornerstoneTM 130
Selection of narrow bandwidth excitation for PDS measurement
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probe laser beam
635 nm
Detection of beam deflection caused by absorption-generated heat gradient in PDS measurement
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