研究目的
Investigating the improvement of open-circuit voltage (Voc) and power-conversion efficiency (PCE) in Sb2Se3 thin-film solar cells through the optimization of the absorber layer preparation process.
研究成果
The study successfully demonstrated the fabrication of Sb2Se3 thin-film solar cells with a high Voc of 504 mV and a PCE of 6.84%, representing the highest efficiency for sputtered Sb2Se3 solar cells. The improvement in Voc is attributed to reduced defect density, passivated interfacial defects, and Cd and S inter-diffusion at the heterojunction interface.
研究不足
The study focuses on the optimization of Sb2Se3 thin-film solar cells through sputtering and selenization processes. Potential limitations include the scalability of the process for industrial applications and the environmental impact of using CdS as a buffer layer.
1:Experimental Design and Method Selection:
The study involved the preparation of Sb2Se3 absorber layers via a combination reaction of sputtered and selenized Sb precursor thin films. The methodology included RF magnetron sputtering for Sb precursor deposition and post-selenization heat treatment for Sb2Se3 formation.
2:Sample Selection and Data Sources:
Mo-coated soda lime glass was used as the substrate. Sb precursor thin films with varying thicknesses were prepared by controlling sputtering time.
3:List of Experimental Equipment and Materials:
High-purity Sb sputtering target, Se powder, RF magnetron sputtering system, double-chamber vacuum tubular furnace for selenization.
4:Experimental Procedures and Operational Workflow:
The process included substrate cleaning, Sb precursor deposition, selenization, CdS buffer layer deposition via chemical bath deposition, heterojunction heat treatment, ITO window layer deposition, and Ag electrode evaporation.
5:Data Analysis Methods:
Characterization techniques included XRD, SEM, TEM, UV/Vis/NIR spectrophotometry, J-V measurements, EQE spectra, EBIC measurements, C-V measurements, DLCP, and admittance spectroscopy.
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RF magnetron sputtering system
Deposition of Sb precursor thin films
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Double-chamber vacuum tubular furnace
Post-selenization heat treatment
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X-ray diffraction (XRD)
Ultima-iv
Characterization of crystal structure
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Thermal field emission scanning electron microscope (SEM)
Zeiss SUPRA 55
Observation of surface and cross-sectional morphologies
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Energy dispersive X-ray spectroscope (EDS)
BRUKER QUANTAX 200
Analysis of chemical compositions and elemental distribution
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Transmission electron microscopy (TEM)
FEI Titan Cubed Themis G2 300
Morphological and structural characterization
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Focused ion beam (FIB)
FEI Scios
Sample preparation for TEM
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UV/Vis/NIR spectrophotometer
Shimadzu UV-3600
Optical reflectance investigation
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Multi-meter
Keithley, 2400 Series
Current density-voltage (J-V) curves measurement
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Solar simulator
3A
AM 1.5G light illumination
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External quantum efficiency (EQE) system
Zolix SCS101
EQE spectra measurement
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Electron beam-induced current (EBIC) microscope
Quanta 400 FEG FEI
EBIC measurements
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Smart EBIC
Gatan, Inc.
EBIC measurements
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Janis VPF-100 cryostat
Temperature-dependent capacitance-frequency measurements
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