研究目的
Investigating the fabrication and characterization of SnS2 nanoflakes based UV photodetector for high sensitivity and thermal stability applications.
研究成果
The fabricated SnS2 nanoflakes based UV photodetector offers high contrast ratio, responsivity, and detectivity under UV light illumination, with good thermal stability. It is a promising candidate for UV photodetection applications due to its simple and cost-effective fabrication.
研究不足
The response time of the fabricated photodetector is relatively slow (～2.2 s), attributed to the large channel spacing between two Ag electrodes.
1：Experimental Design and Method Selection:
Solvothermal synthesis of SnS2 nanoflakes and fabrication of a photoconductor structure on SiO2/Si substrate using Ag as contact material.
2：Sample Selection and Data Sources:
p-silicon substrate with a resistivity of 2-7 ohm-cm, synthesized SnS2 nanoflakes.
3：List of Experimental Equipment and Materials:
Rigaku smart-lab 9 kW for X-RD analysis, Raman Spectrophotometer (Renishaw inVia, Germany), PerkinElmer, Lambda 25-UV/Vis Spectrometer, LS-45 Fluorescence Spectrometer, PerkinElmer, Tecnai G2 20 Twin of FEI, USA for TEM analysis, NTEGRA Prima, NT-MDT Service & Logistics Ltd. for AFM, Keysight, B1500A parameter analyzer for electrical characterization.
4：Experimental Procedures and Operational Workflow:
Synthesis of SnS2 nanoflakes, spin coating on SiO2/Si substrate, patterning Ag electrodes, structural and optical characterizations, electrical characterization under UV light illumination.
5：Data Analysis Methods:
Analysis of X-RD, Raman spectra, absorption spectra, PL spectra, TEM, HR-TEM, SAED pattern, AFM, I-V characteristics, responsivity, detectivity, and time response measurements.
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Parameter analyzer
B1500A
Keysight
Electrical characterization
-
Rigaku smart-lab
9 kW
Rigaku
X-ray diffraction analysis
-
UV/Vis Spectrometer
Lambda 25
PerkinElmer
Absorption spectra analysis
-
Fluorescence Spectrometer
LS-45
PerkinElmer
Photoluminescence analysis
-
Transmission electron microscopy
Tecnai G2 20 Twin
FEI
TEM, HR-TEM, and SAED pattern analysis
-
Raman Spectrophotometer
inVia
Renishaw
Raman analysis
-
Atomic force microscopy
NTEGRA Prima
NT-MDT Service & Logistics Ltd.
AFM analysis
-
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