研究目的
Investigating the effect of potassium ions on the stability and efficiency of wide-bandgap perovskite solar cells (PSCs) with high Br content.
研究成果
The incorporation of potassium ions significantly improves the stability and efficiency of wide-bandgap perovskite solar cells by reducing trap density and inhibiting ion migration, leading to suppressed nonradiative recombination and photoinduced phase segregation.
研究不足
The study focuses on the effect of potassium incorporation on wide-bandgap perovskites with high Br content, and the optimal doping concentration may vary for perovskites with different compositions.
1：Experimental Design and Method Selection:
Incorporation of potassium iodide (KI) into wide-bandgap perovskite films with high Br content to investigate the effect on properties.
2：Sample Selection and Data Sources:
Wide-bandgap perovskite films with Cs
3：05FA79MA16Pb(I6Br4)3 component as control samples. List of Experimental Equipment and Materials:
Field-emission scanning electron microscope (Hitachi SU70), Rigaku diffractometer (D/max 2400), UV–vis spectrometer (Hitachi U3900), Edinburgh FLS920 spectrofluorometer, Thermo Scientific ESCALab 250 XPS, Bruker Multimode 8 AFM system, Keithley 4200-SCS source, Newport 94021A solar simulator, Crown-Tech EQE measurement system (QTest Station 1000AD), Autolab 302N electrochemical workstation.
4：Experimental Procedures and Operational Workflow:
Fabrication of perovskite solar cells with ITO/SnO2/perovskite/Spiro-OMeTAD/Au structure, characterization of films and devices.
5：Data Analysis Methods:
Analysis of XRD patterns, SEM images, UV–Vis absorption spectra, PL and TRPL spectra, XPS spectra, KPFM, EIS, Mott–Schottky plots, dark J–V curves.
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Source meter
4200-SCS
Keithley
Obtaining J–V curves of the devices
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Electrochemical workstation
302N
Autolab
Performing EIS and Mott–Schottky measurements
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Field-emission scanning electron microscope
SU70
Hitachi
Obtaining SEM images of perovskite films
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X-ray diffractometer
D/max 2400
Rigaku
Acquiring XRD patterns of perovskite films
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UV–vis spectrometer
U3900
Hitachi
Measuring absorption spectra of perovskite films
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Spectrofluorometer
FLS920
Edinburgh
Recording steady-state PL and time-resolved PL spectra
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XPS
ESCALab 250
Thermo Scientific
Performing XPS analysis on perovskite films
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AFM system
Multimode 8
Bruker
Performing scanning probe microscopy techniques
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Solar simulator
94021A
Newport
Providing AM 1.5G sun light for device measurement
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EQE measurement system
QTest Station 1000AD
Crown-Tech
Measuring EQE of the devices
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