研究目的
Investigating the growth and magnetic properties of ultrathin films of L10-MnAl on GaAs (001) substrates without the need for a buffer layer, and understanding the formation of a ferromagnetic interface consisting of Mn-Ga-As-Al.
研究成果
Ultrathin MnAl films showing the ferromagnetic L10-MnAl phase have been grown without any buffer layer, achieving coercivities over 8 kOe. These films show a strong out-of-plane magnetic anisotropy, which may be advantageous for their application in spintronic systems. The presence of an interface Ga-Mn-Al-As compound is responsible for the soft magnetic signal recorded in the ultrathin films under study.
研究不足
The study is limited to ultrathin films of MnAl on GaAs (001) substrates, and the findings may not be directly applicable to other substrates or thicker films. The presence of a soft magnetic interface phase may affect the overall magnetic properties of the films.
1：Experimental Design and Method Selection:
Ultrathin films of MnAl were grown on GaAs (001) by MBE with thickness varying from 1 to 5 nm. XPS and LEED were performed in situ to characterize the chemical states and the arrangement of the surface atoms. Magnetic and structural characterization was performed ex situ by SQUID and XRD.
2：Sample Selection and Data Sources:
GaAs substrates were prepared in situ with typical ultrahigh vacuum cleaning procedures to remove the native oxide.
3：List of Experimental Equipment and Materials:
MBE chamber, XPS, LEED, SQUID, XRD, GaAs substrates, Mn and Al evaporation materials.
4：Experimental Procedures and Operational Workflow:
MnAl films were grown by alternating monolayers of Mn and Al on GaAs (001). The substrates were kept at different temperatures during growth, with some samples receiving a post-growth thermal treatment at 400°C.
5：1). The substrates were kept at different temperatures during growth, with some samples receiving a post-growth thermal treatment at 400°C.
Data Analysis Methods:
5. Data Analysis Methods: XPS and XRD results were used to determine the thickness of the films. Magnetic properties were measured by SQUID magnetometry.
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