研究目的
To understand the mechanism of the change of the electronic properties of the interface of MoO3 with the BHJ formed by P3HT and PCBM, particularly the effect of moisture exposure on the dipole at the MoO3/BHJ interface.
研究成果
The dipole formed at the MoO3/BHJ interface decreases when the interface is exposed to air due to the diffusion of H2O to the interface. This change in the dipole affects the energy level alignment and charge transport across the interface, which has implications for the efficiency and performance of organic electronic devices.
研究不足
The study focuses on the MoO3/P3HT:PC61BM interface and the effects of moisture exposure. The findings may not be directly applicable to other metal oxide/organic interfaces without further research.
1:Experimental Design and Method Selection:
X-ray photoelectron spectroscopy (XPS), metastable impact electron and UV-light photoelectron spectroscopy (MIES and UPS), and inverse photoelectron spectroscopy (IPES) were used to analyze the composition and electronic properties of the MoO3/P3HT:PC61BM interface.
2:Sample Selection and Data Sources:
High purity fullerene PC61BM and electronic grade polymer P3HT were used to fabricate BHJ layers.
3:List of Experimental Equipment and Materials:
SPECS apparatus for XPS, cold cathode two stage discharge source for MIES and UPS, Geiger Müller type photon detector for IPES.
4:Experimental Procedures and Operational Workflow:
MoO3 was evaporated onto the BHJ layer in high vacuum, samples were exposed to air for various times, and analyzed with the mentioned spectroscopy techniques.
5:Data Analysis Methods:
Singular value decomposition (SVD) was used to decompose the spectra and analyze the results.
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