研究目的
Investigating the charging behavior of an amorphous carbon thin film at liquid-nitrogen temperature under focused electron-beam irradiation.
研究成果
The study concludes that amorphous carbon thin films exhibit negative charging under focused electron-beam irradiation at liquid-nitrogen temperature, attributed to electron-stimulated desorption of adsorbed molecules. The films show sufficient electrical conductivity even at low temperatures, preventing positive charging. This finding has implications for the operation of hole-free phase plates in cryo-TEM applications.
研究不足
The study is limited by the specific conditions of electron-beam irradiation and the temperature at which the experiments were conducted. The physical reason for the conductivity enhancement of aC thin films under electron irradiation is not fully understood.
1：Experimental Design and Method Selection:
The study involved TEM investigations and multi-probe STM measurements to analyze the charging behavior and conductivity of amorphous carbon thin films under electron-beam irradiation at liquid-nitrogen temperature.
2：Sample Selection and Data Sources:
Amorphous carbon thin films were fabricated by electron-beam evaporation and transferred onto Cu grids.
3：List of Experimental Equipment and Materials:
A Hitachi HF?3300 TEM equipped with a cold field emission gun, a cryo-specimen holder, and an Omicron Nanoprobe for STM measurements.
4：Experimental Procedures and Operational Workflow:
The aC thin film was irradiated with a focused electron beam at liquid-nitrogen temperature, and the charging behavior was analyzed through EEL spectra and HFPP images. Conductivity measurements were performed using multi-probe STM.
5：Data Analysis Methods:
The data was analyzed to extract information on changes in the relative thickness of the aC thin film and on the polarity and amount of charge built up on the aC thin film.
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