摘要： The imaging of electric fields with the pnCCD (S)EM camera allows for the fast, direct, and precise measurement of electric fields in various materials. Techniques providing fast, direct, and precise measurement of the electric field distribution are of great interest for modern materials research. We present a fast, direct, and precise measurement of the electric field distribution in the nanometer scale with the pnCCD (S)EM camera. With this technique, small shifts of the bright field image due to the electric field can be detected with a precision of less than 1 nm. The large number of pixels (264 × 264) allows for the simultaneous measurement of the electric field in a large area. The fast readout (1.2 kHz) enables the observation of dynamic processes. The direct measurement of the electric field avoids the need for complex simulations or indirect methods. The pnCCD (S)EM camera is thus a powerful tool for the investigation of electric fields in materials.