研究目的
To investigate the growth of ZnSe nanowires on quartz substrates and their photomodulated transmittance spectra.
研究成果
ZnSe nanowires were successfully grown on fused quartz substrates by a vapor transport method. The nanowires were characterized by SEM and XRD, revealing a single phase of zinc-blende ZnSe. PT measurements at temperatures from 15 to 300 K revealed clear structures of E0 critical point, which were interpreted by a one-electron line shape plus an excitonic shape. The temperature dependence of E0 data were analyzed by a formula considering the band-gap shrinkage effect due to electron?phonon interaction in semiconductors. The exciton binding energy of ZnSe nanowires was determined to be 20 meV.
研究不足
The study is limited to the growth and optical characterization of ZnSe nanowires on quartz substrates. The discrepancy in the temperature dependence of E0 energy between nanowire and bulk data at lower temperatures is unclear.
1:Experimental Design and Method Selection:
ZnSe nanowires were grown by a simple vapor transport method using a two-zone horizontal furnace. The fused quartz plates were used as substrates. A 10 ?A thick gold layer was evaporated on the substrates as a catalyst. The zinc selenide powder was put into the furnace at the high temperature zone (~1100?C), and the substrates were placed in the low temperature zone about 30 cm downstream from the ZnSe source powder. The Ar carrier gas was kept ?owing (500 sccm) through the furnace during the growth. The growth time was 1 minute after the temperature of the growth-zone became 800?C. After the growth, the substrates were taken from the furnace and cooled down to room temperature.
2:Sample Selection and Data Sources:
The ZnSe nanowires grown on the quartz substrate were observed using a scanning electron microscope (SEM). The crystallinity of the ZnSe nanowires was evaluated by an X-ray di?raction (XRD) technique.
3:List of Experimental Equipment and Materials:
SEM (JSM-6330F, JEOL, Ltd.), XRD (RINT 2100V, Rigaku Co., Ltd.), spectrometer (Horiba-Jobin Yvon iHR320), 50 W halogen lamp (Ushio Co., Ltd.), thermoelectrically cooled photomultiplier tube (Hamamatsu R375), He-Cd laser (Kimmon IK3302R-E), closed-cycle refrigerator cryostat (CryoMini, Iwatani Industrial Gases Corp.).
4:Experimental Procedures and Operational Workflow:
The PT and optical transmittance measurements were performed using a spectrometer, a 50 W halogen lamp, and a thermoelectrically cooled photomultiplier tube. The 325 nm line of a He-Cd laser was used as the pumping light for PT measurements. The optical measurements were carried out on the same system for all temperatures from 15 and 300 K using a closed-cycle refrigerator cryostat.
5:Data Analysis Methods:
The PT spectrum was analyzed using the standard critical point (SCP) model. The temperature dependence of the band-gap energy E0(T) was described by the formula of Varshni and later P¨assler.
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