研究目的
To design a simple methodology to obtain mesoporous niobium pentoxide (Nb2O5) solids functionalized with nitrogen, carbon, or sulfur and to characterize their structural and optical properties for potential applications in photocatalytic processes.
研究成果
Doping mesoporous Nb2O5 with N, C, or S significantly affects its optical properties, reducing the band gap energy and enhancing visible light absorption, which is beneficial for photocatalytic applications. The synthesis method is simple and reproducible, yielding materials with potential for environmental and energy applications.
研究不足
The study focused on the synthesis and characterization of doped mesoporous Nb2O5, with limited exploration of their photocatalytic performance in specific applications. The effect of dopant concentration on material properties was not extensively varied.
1:Experimental Design and Method Selection:
A sol–gel process was used with CTAB as a surfactant to synthesize mesoporous Nb2O5. Dopants were incorporated via dry milling with urea, citric acid, or thiourea followed by calcination.
2:Dopants were incorporated via dry milling with urea, citric acid, or thiourea followed by calcination. Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Samples were synthesized with varying concentrations of CTAB and NbCl5, then doped with N, C, or S.
3:List of Experimental Equipment and Materials:
Cetyltrimethyl ammonium bromide (CTAB — Merck), niobium chloride, urea, citric acid, thiourea, NH4OH, ethanol, deionized water.
4:Experimental Procedures and Operational Workflow:
CTAB was dissolved in water, pH adjusted with NH4OH, NbCl5 in ethanol was added, stirred, aged, filtered, washed, dried, and calcined. Dopants were added by dry milling and calcination.
5:Data Analysis Methods:
Characterization techniques included IR, Raman, UV–Vis spectroscopies, XRD, BET surface area analysis, TEM, and SEM.
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Bruker D2-PHASER X-ray diffractometer
D2-PHASER
Bruker
Used for X-ray diffraction (XRD) analysis
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JEOL-2010 electronic microscope
2010
JEOL
Used for transmission electron microscopy (TEM)
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JEOL-5900 LV microscope
5900 LV
JEOL
Used for scanning electron microscopy (SEM)
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Cetyltrimethyl ammonium bromide
CTAB
Merck
Surfactant used as pore generating agent in the synthesis of mesoporous Nb2O5
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Nicolet IR-200 infrared spectrophotometer
IR-200
Nicolet
Used for Fourier transform infrared spectroscopy (FTIR) analysis
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EZRaman-N Raman analyzer
EZRaman-N
Enwave Optronics
Used for Raman spectroscopy analysis
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Varian Cary 5E Uv–Vis–NIR spectrophotometer
Cary 5E
Varian
Used for diffuse reflectance UV–Vis spectroscopy
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ChemBET PULSAR surface analyzer
PULSAR
ChemBET
Used for BET surface area analysis
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