研究目的
Investigating the second and third order nonlinear optical properties of a novel thiophene substituted chalcone derivative for optoelectronic device applications.
研究成果
The TTMP chalcone derivative exhibits excellent thermal stability, high transparency in the visible and IR region, and promising second and third order nonlinear optical properties, making it a potential candidate for optoelectronic device applications.
研究不足
The study is limited to the characterization of the synthesized TTMP chalcone derivative and its nonlinear optical properties under specific experimental conditions. Further studies may be required to explore its performance in actual optoelectronic devices.
1:Experimental Design and Method Selection
The TTMP chalcone was synthesized using Claisen-Schmidt condensation reaction. Single crystals were grown using slow evaporation method. The structural, thermal, and optical properties were analyzed using various spectroscopic and analytical techniques.
2:Sample Selection and Data Sources
Analytical Reagent (AR) grade of chemicals 3, 4, 5 trimethoxy benzaldehyde and 2-acetyl thiophene were used for synthesis. The grown crystals were analyzed for their properties.
3:List of Experimental Equipment and Materials
Avatar 370 FT-IR spectrometer, BRUKER RFS 27 FT-Raman Spectrometer, Shimadzu 1800 UV–Visible spectrophotometer, SDT Q600 V20.9 Build 20 thermal analyser, Nd:YAG laser, Diode-Pumped Solid State (DPSS) Continuous Wave (CW) laser.
4:Experimental Procedures and Operational Workflow
The synthesis involved mixing 3, 4, 5 trimethoxy benzaldehyde with 2-acetylethiophe in methanol, catalyzed by NaOH. The product was crystallized using acetone. The crystals were then subjected to various analyses including FTIR, FT-Raman, UV-Vis-NIR, thermal analysis, SHG efficiency measurement, and Z-scan technique for nonlinear optical properties.
5:Data Analysis Methods
The data from various spectroscopic and analytical techniques were analyzed to determine the structural, thermal, and optical properties of the TTMP crystals. The Z-scan data was fitted theoretically to estimate nonlinear optical parameters.
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Avatar 370 FT-IR spectrometer
370
Thermo Nicolet
Used for collecting FT-IR spectrum
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BRUKER RFS 27 FT-Raman Spectrometer
RFS 27
BRUKER
Used for collecting FT-Raman spectrum
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Shimadzu 1800 UV–Visible spectrophotometer
1800
Shimadzu
Used for collecting UV-Vis-NIR spectrum
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SDT Q600 V20.9 Build 20 thermal analyser
Q600 V20.9 Build 20
SDT
Used for thermal analysis
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Nd:YAG laser
Used for SHG efficiency measurement
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Diode-Pumped Solid State (DPSS) Continuous Wave (CW) laser
Used for Z-scan technique
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