研究目的
To demonstrate the growth of coherent, strain-engineered phases of epitaxial SrSnO3 (SSO) films using a radical-based molecular beam epitaxy approach and to investigate their crystal and electronic structures as a function of strain for high mobility oxide electronics operating at room temperature.
研究成果
Strain engineering results in the stabilization of different polymorphs of SSO at room temperature, leading to a significant enhancement in electron mobility. This opens up opportunities to tailor high-mobility oxide heterostructure properties through doping, strain and phase optimization.
研究不足
The identification of polymorphic phases based on the lattice parameter alone is non-trivial. Additional factors such as reduced defect scattering and/or changes in the phonon band structure that affects the electron-phonon scattering could be responsible for the increased electron mobility in the tetragonal phase.
1:Experimental Design and Method Selection
A radical-based molecular beam epitaxy (MBE) approach was employed to grow SSO films on different substrates. Synchrotron x-ray scattering was used for structural characterization.
2:Sample Selection and Data Sources
SSO films were grown on GdScO3 (110), PrScO3 (110), and BSO-buffered STO (001) substrates.
3:List of Experimental Equipment and Materials
Hexamethylditin (HMDT) was used as the metal-organic chemical precursor for Sn. Sr and La were evaporated using effusion cells, and oxygen was supplied using an RF plasma source.
4:Experimental Procedures and Operational Workflow
SSO films were grown by co-depositing Sr, HMDT and oxygen. Reflection high-energy electron diffraction (RHEED) was utilized to monitor the growth in-situ.
5:Data Analysis Methods
Synchrotron-based x-ray diffraction was performed to extract the out-of-plane and in-plane lattice parameters of SrSnO3 films. DFT calculations were performed to analyze the electronic band structures.
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