研究目的
To investigate the effects of silver nanowires/graphene nanocomposites (AgNWs-GNs) on the properties of electrically conductive adhesives (ECAs), focusing on improving electrical conductivity and shear strength.
研究成果
The self-assembly method successfully prepared AgNWs-GNs nanocomposites, which significantly improved the electrical conductivity and shear strength of ECAs. The optimal performance was achieved with 0.8% AgNWs/GNs for lowest volume resistivity and 0.6% AgNWs/GNs for highest shear strength.
研究不足
The study focuses on the effects of AgNWs-GNs on ECAs' electrical conductivity and shear strength but does not explore other potential applications or the long-term stability of the nanocomposites under various environmental conditions.
1:Experimental Design and Method Selection:
A facile self-assembly method was used to fabricate AgNWs-GNs nanocomposites. The nanocomposites were characterized using FTIR, XRD, XPS, TEM, and Raman tests.
2:Sample Selection and Data Sources:
Different amounts of AgNWs-GNs were used as additives in micron flake silver filler to study their effects on ECAs.
3:List of Experimental Equipment and Materials:
Included electric thermostat blast drying oven, vacuum drying oven, ultrasonic cleaner, electric blender, constant temperature magnetic stirrer, high speed desktop centrifuge, SEM, TEM, automatic X-ray diffractometer, Fourier transform infrared spectrometer, Raman spectrometer, X-ray photoelectron spectrometer, electronic universal testing machine, and double electric logging four-point probe tester.
4:Experimental Procedures and Operational Workflow:
The nanocomposites were prepared, characterized, and then used as fillers in ECAs. The ECAs were tested for shear strength and electrical conductivity.
5:Data Analysis Methods:
The performance of ECAs was evaluated by shear strength and shear electrical conductivity tests, with each test repeated 5 times for accuracy.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
Scanning electron microscopy
Merlin
Zeiss
Used for imaging samples at high resolution.
-
Transmission electron microscope
JEM-2100F
Japan Electronics Corporation
Used for imaging samples at atomic resolution.
-
Automatic X-ray diffractometer
AXS D8
Bruker
Used for analyzing the crystal structure of samples.
-
Fourier transform infrared spectrometer
Equinox-55
Bruker
Used for analyzing the chemical composition of samples.
-
X-ray photoelectron spectrometer
Axis Ultra
Shimadzu Kratos
Used for analyzing the surface chemistry of samples.
-
Electric thermostat blast drying oven
DHG-9240A
Shanghai Shenxian Thermostatic Equipment
Used for drying samples at controlled temperatures.
-
Vacuum drying oven
DZF-6050
Shanghai Shenxian Thermostatic Equipment
Used for drying samples under vacuum conditions.
-
Ultrasonic cleaner
KII2200
Kunshan Hechuang Ultrasonic Instrument
Used for cleaning samples using ultrasonic waves.
-
Electric blender
JJ-1A
Changzhou Aohua Instrument Co., Ltd.
Used for mixing samples.
-
Constant temperature magnetic stirrer
Feb-85
Shanghai Sile Instrument Co., Ltd.
Used for stirring samples at constant temperatures.
-
High speed desktop centrifuge
TG1650-WS
Xiangyi Centrifuge Instrument
Used for separating samples based on density.
-
Raman spectrometer
LabRAM Aramis
H.J.Y
Used for analyzing the vibrational modes of molecules in samples.
-
Electronic universal testing machine
AG-IC50kN
Suzhou Shimading Instrument Co., Ltd.
Used for testing the mechanical properties of samples.
-
Double electric logging four-point probe tester
RTS-9
Beijing Jinshisu Instrument Equipment Co., Ltd.
Used for measuring the electrical resistivity of samples.
-
登录查看剩余12件设备及参数对照表
查看全部