研究目的
To develop a rapid, accurate, and environmentally friendly method for the determination of silicon in plants using wavelength dispersive X‐ray fluorescence (WD‐XRF) spectrometry.
研究成果
The developed WD‐XRF methodology for determining silicon in plants is rapid, accurate, and environmentally friendly, with low uncertainties. It avoids the use of hazardous reagents and allows for reanalysis of samples due to the long useful lifetime of fused beads.
研究不足
The method requires calcination of samples at high temperatures and preparation of fused beads, which may not be suitable for all types of plant materials. The linear range for silicon concentration is limited to 6 to 55 wt% SiO2.
1：Experimental Design and Method Selection:
The study involved developing a method for silicon determination in plants using WD‐XRF spectrometry, focusing on sample preparation and measurement conditions.
2：Sample Selection and Data Sources:
Horsetail (Equisetum arvense L.) and nettle leaf (Urtica dioica) were selected for their silicon content. Certified reference materials and chemical products were used to prepare calibration standards.
3：List of Experimental Equipment and Materials:
Equipment included a PANalytical model AXIOS X‐ray fluorescence wavelength‐dispersive spectrometer, a PerkinElmer model AAnalyst 400 atomic absorption spectrometer, and various materials for sample preparation.
4：Experimental Procedures and Operational Workflow:
Samples were dried, milled, calcined at 700°C, and prepared as fused beads for WD‐XRF measurement. Calibration standards were prepared to match the sample matrix.
5：Data Analysis Methods:
Silicon concentration was determined using WD‐XRF, with validation performed by comparing results with atomic absorption spectrometry (AAS).
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