研究目的
To investigate the effect of laser fluence on the optical, structural, and surface roughness properties of Bi2O3 thin films prepared by pulsed laser deposition.
研究成果
Bi2O3 thin films were successfully prepared using PLD, with XRD confirming polymorphous structures and AFM showing grain size variations from 33.48 to 131.64 nm. The optical band gap ranged from 1.7 to 2.9 eV, influenced by laser fluence. Optimal conditions were found at 7.8 J/cm2 for complete oxidation, but further studies could optimize parameters for better film quality.
研究不足
The study is limited to specific laser fluence ranges and constant oxygen pressure and temperature; incomplete oxidation observed at some fluences may affect film purity; grain size and band gap variations might be influenced by experimental conditions not fully optimized.
1：Experimental Design and Method Selection:
A pulsed laser deposition (PLD) system was used to deposit Bi2O3 thin films on quartz substrates, varying laser fluence to study its impact on properties.
2：Sample Selection and Data Sources:
Pure bismuth metal target (99.99% purity) with 2.5 cm diameter and 0.5 cm thickness; substrates cleaned using ultrasonic bath with a solution of CH3COOH, HNO3, HF, and DDIW in 2:1:1:10 ratios.
3：99% purity) with 5 cm diameter and 5 cm thickness; substrates cleaned using ultrasonic bath with a solution of CH3COOH, HNO3, HF, and DDIW in
3. List of Experimental Equipment and Materials: Q-switching Nd-YAG laser (
4：List of Experimental Equipment and Materials:
1.06 μm, 9 nsec pulse width), PLD system, ultrasonic bath, chemicals for cleaning. 4. Experimental Procedures and Operational Workflow: Laser fluence varied at 1.8, 3.8, 5.8, 7.8, and 9.8 J/cm2; oxygen pressure and substrate temperature kept constant at 100 mbar and 423K, respectively; films characterized using XRD for structural analysis, AFM for surface morphology, and optical transmission for band gap estimation.
5：06 μm, 9 nsec pulse width), PLD system, ultrasonic bath, chemicals for cleaning. Experimental Procedures and Operational Workflow:
5. Data Analysis Methods: XRD patterns analyzed for phase identification; AFM used to measure grain size; optical transmission data used with Tauc plot method to estimate energy band gap.
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