研究目的
Investigating the electroluminescence intensity of polyimide films under high DC electric fields and analyzing the reliability of breakdown data using Weibull distribution.
研究成果
The EL intensity of PI films increases with electric field above 2.00 MV/cm, with a rapid increase near 2.80 MV/cm indicating hot electron effects. The Weibull distribution analysis showed high reliability (0.92 and 0.91 for lifetime and breakdown field, respectively), with mid-values of 164.9 minutes and 2.76 MV/cm. This method provides a way to assess material stability and reliability for industrial applications.
研究不足
The study is limited to DC electric fields and room temperature conditions; AC voltage and other environmental factors were not considered. The sample size was small (nine groups), which may affect statistical robustness. The lifetime value (164.9 min) is from accelerated testing and may not represent real industrial applications.
1：Experimental Design and Method Selection:
The study used a self-designed experimental setup to measure electroluminescence (EL) intensity under DC high electric fields. The Weibull distribution method was employed for statistical analysis of reliability.
2：Sample Selection and Data Sources:
Polyimide films with a thickness of 15 μm from 3M Corporation were used. Samples were cut into 60x60 mm pieces, sputter-coated with gold electrodes, and dried to remove residual charges.
3：List of Experimental Equipment and Materials:
Equipment includes an adjustable DC voltage source (DWN153-5AC, Tianjin, China), a photon counter (R943, Hamamatsu, Japan), a vacuum chamber with a turbo molecular pump, brass electrodes, and a light-tight chamber. Materials include polyimide films and gold for electrodes.
4：Experimental Procedures and Operational Workflow:
EL experiments were conducted under DC stress, with voltage increased stepwise. Luminescence measurements were taken after 10 minutes at each voltage to achieve steady state. The setup involved mounting samples between electrodes in a vacuum to avoid surface discharges.
5：Data Analysis Methods:
Data were analyzed using the Weibull distribution function to calculate cumulative failure probability, lifetime, and breakdown field. Software used was Origin 8.0 for linear regression and reliability assessment.
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