研究目的
Demonstrate multimodal imaging with a spatial resolution approaching 10 nm and confirm it with a variety of characterization methods, and evaluate a model materials system of interest in material science to fill the current gap between resolution demonstration and real scientific applications.
研究成果
The study achieved a hard x-ray focus size with FWHM of approximately 13.9x12.3 nm2 using ptychography and imaging resolution down to 10.5x10.8 nm2 via PSD analysis. Multimodal imaging enabled detailed characterization of a MIEC membrane, revealing an emergent material phase at grain boundaries. This work bridges the gap between resolution demonstration and practical scientific applications, showcasing the capability for nanoscale studies in material science.
研究不足
The actual focus size is slightly larger than the diffraction-limited value due to minor zone placement errors in the lenses and possible misalignment. Beam instability caused artifacts in phase images, though a feedback system was later implemented to improve stability. The efficiency of the lens system was 5.7%, with potential for improvement using wedged MLLs and higher ring currents.
1：Experimental Design and Method Selection:
The experiment used scanning hard x-ray microscopy with crossed multilayer Laue lenses (MLLs) to focus x-rays to a nanoscale beam. Techniques included ptychography reconstruction, knife-edge scans, power spectrum density (PSD) analysis, and multimodal imaging (absorption, phase, and fluorescence contrast).
2：Sample Selection and Data Sources:
Samples included cubic Au nanoparticles for resolution characterization and a mixed ionic-electronic conducting (MIEC) ceramic membrane (Ce
3：8Gd2O2?x and CoFe2O4) for application studies. The membrane sample was prepared using focused ion beam (FIB) harvesting. List of Experimental Equipment and Materials:
Equipment included multilayer Laue lenses (vMLL and hMLL with specific apertures and zone widths), energy-dispersive detector (Vortex silicon drift detector), pixel-array detector (Merlin with 512x512 pixels and 55 μm pixel size), and beamline optics at the Hard x-ray Nanoprobe Beamline (HXN) of NSLS-II. Materials included Au nanoparticles, Pt test patterns, and the MIEC membrane.
4：Experimental Procedures and Operational Workflow:
A coherent monochromatic beam at 12 keV was focused using crossed MLLs. The sample was raster-scanned through the nanofocus with steps of 5-10 nm. Fluorescence signals were collected for elemental imaging, and far-field diffraction patterns were captured for absorption and phase imaging. Data were analyzed using ptychography, DPC, and PSD methods.
5：Data Analysis Methods:
Data analysis involved Gaussian fitting for focus size, Fourier transform for MTF, nonlinear fitting for knife-edge scans, and PSD for resolution limits. Software tools for ptychography and DPC algorithms were used.
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