研究目的
To investigate the effect of surface finish (mirrorlike or brushed) on the morphology and chemical composition of samarium thin films molecular plated from N,N-dimethylformamide, using XPS characterization.
研究成果
The XPS analysis revealed that samarium thin films molecular plated from DMF onto stainless steel substrates with different finishes have similar chemical compositions, primarily Sm(III) oxide with carbon and oxygen. The key difference is in the relative amounts of carbon species: the mirrorlike finish sample had higher C-to-C bond carbon, suggesting more trapped solvent or degradation products, while the brushed finish had higher carbonate-type carbon. This indicates that surface finish influences the adsorption and stability of carbon-containing species, which is important for optimizing thin film quality in applications like nuclear source production. Future work should extend to actinides and investigate other solvents or deposition parameters.
研究不足
The study is limited to samarium as a surrogate for actinides; actual actinide films might behave differently. The analysis focused on surface composition via XPS, which may not capture bulk properties or other morphological aspects. Minor sodium contamination was present, potentially from handling or acid solutions, which could affect results. The crystallinity and conductivity of the films were unknown, and the study did not explore long-term stability or other solvent systems.
1：Experimental Design and Method Selection:
The study used XPS to characterize samarium thin films deposited via molecular plating from DMF solutions onto stainless steel substrates with different surface finishes. The rationale was to evaluate how surface roughness affects film composition and morphology, particularly for potential use in actinide thin film production.
2：Sample Selection and Data Sources:
Two samples were prepared: one on mirrorlike (#8 finish) stainless steel and one on brushed (#4 finish) stainless steel. Samarium was molecular plated from a DMF solution containing 0.444 mM SmCl3, using a constant current of 0.7 mA cm?2 for 15 minutes, with a platinum anode.
3：444 mM SmCl3, using a constant current of 7 mA cm?2 for 15 minutes, with a platinum anode.
List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment included a Thermo Scientific K-Alpha XPS spectrometer, Thermo Scientific FG-03 charge neutralization source, Thermo Scientific EX-06 ion gun, scanning electron microscope for ex situ examination, and materials such as stainless steel substrates, SmCl3, DMF, hydrochloric acid, and platinum plates.
4：Experimental Procedures and Operational Workflow:
The thin films were deposited electrochemically, rinsed with DMF, dried in a fume hood, and stored in Petri dishes. XPS analysis was performed with survey and high-resolution scans of Sm 3d, O 1s, and C 1s regions under specific conditions (e.g., analyzer pass energy of 50 eV or 200 eV, emission angle of 45°, temperature of 300 K, pressure <2×10?5 Pa). Charge neutralization was applied using a dual-beam source.
5：Data Analysis Methods:
Data were analyzed using Thermo Avantage software version 4.61, with Shirley background subtraction, Gaussian peak fitting, and quantification using Al Scofield sensitivity factors to determine atomic concentrations.
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