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Time-resolved photoluminescence spectral analysis of phonon-assisted DAP and e-A recombination in N+B-doped <i>n</i> -type 4H-SiC epilayers

DOI:10.1088/1361-6463/aaf8e9 期刊:Journal of Physics D: Applied Physics 出版年份:2019 更新时间:2025-09-19 17:15:36
摘要: It is crucial to clarify the roles of phonon-assisted donor-acceptor pairs (DAPs) and free-to-acceptor (e-A) emissions in n-type 4H-SiC doped with nitrogen (N) and boron (B), where N and B induce the shallow donor and the D center (deep B) acceptor levels, respectively, in order to understand the complicated carrier recombination mechanism, as well as developing fluorescent SiC with a high color rendering index by controlling the ratio of the two overlapped emissions. Here, time-resolved photoluminescence (TRPL) spectral analyses were performed, in which phonon-assisted DAPs and e-A components were individually recognized. The D center-related green luminescence (1.6–2.8 eV) shows a non-exponential decay followed by a very slow decay in TRPL measurements at room temperature (RT). It emerges that most of the DAP emission intensities decay much faster than e-A emissions and contribute to what is initially fast and non-exponential decay at low temperatures, while the slow decay at RT is mainly from e-A emissions. At a much higher temperature, such as 473 K, only the e-A emission remains and the decay transforms from non-exponential to exponential behavior. High-temperature thermal quenching of e-A emissions exhibits different behaviors for samples with differing B doping concentrations. An activation energy of 0.6 eV was estimated from the Arrhenius plot of e-A emission intensity from a B-doped sample, which matches the D center level. This indicates that the hole thermal emission rate is greatly enhanced at a high temperature, which accelerates the decay of e-A emission intensity at high temperatures.
作者: Anli Yang,Hidekazu Tsuchida,Koichi Murata,Tetsuya Miyazawa,Takeshi Tawara
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To clarify the roles of phonon-assisted donor-acceptor pairs (DAPs) and free-to-acceptor (e-A) emissions in n-type 4H-SiC doped with nitrogen (N) and boron (B) to understand the carrier recombination mechanism and develop fluorescent SiC with a high color rendering index.

The D center-related green luminescence in N+B-doped n-type 4H-SiC involves phonon-assisted DAP and e-A recombinations, with DAP emissions decaying faster at low temperatures and e-A emissions dominating at higher temperatures. The hole thermal emission rate is enhanced at high temperatures, accelerating e-A decay. These findings are crucial for designing buffer layers and developing fluorescent SiC for applications like white light-emitting diodes.

The paper does not explicitly state limitations, but potential areas include the difficulty in distinguishing overlapping DAP and e-A emissions at certain temperatures and the use of specific doping concentrations and temperatures that may not cover all scenarios.

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