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Apparent delocalization of the current density in metallic wires observed with diamond nitrogen-vacancy magnetometry

DOI:10.1103/PhysRevB.99.014436 期刊:Physical Review B 出版年份:2019 更新时间:2025-09-19 17:15:36
摘要: We report on a quantitative analysis of the magnetic field generated by a continuous current running in metallic microwires fabricated on an electrically insulating diamond substrate. A layer of nitrogen-vacancy (NV) centers engineered near the diamond surface is employed to obtain spatial maps of the vector magnetic field, by measuring Zeeman shifts through optically detected magnetic resonance spectroscopy. The in-plane magnetic field (i.e., parallel to the diamond surface) is found to be significantly weaker than predicted, while the out-of-plane field also exhibits an unexpected modulation. We show that the measured magnetic field is incompatible with Ampère’s circuital law or Gauss’s law for magnetism when we assume that the current is confined to the metal, independent of the details of the current density. This result was reproduced in several diamond samples, with a measured deviation from Ampère’s law by as much as 94(6)% (i.e., a 15σ violation). To resolve this apparent magnetic anomaly, we introduce a generalized description whereby the current is allowed to flow both above the NV sensing layer (including in the metallic wire) and below the NV layer (i.e., in the diamond). Inversion of the Biot-Savart law within this two-channel description leads to a unique solution for the two current densities that completely explains the data, is consistent with the laws of classical electrodynamics, and indicates a total NV-measured current that closely matches the electrically measured current. However, this description also leads to the surprising conclusion that in certain circumstances the majority of the current appears to flow in the diamond substrate rather than in the metallic wire, and to spread laterally in the diamond by several micrometers away from the wire. No electrical conduction was observed between nearby test wires, ruling out a conventional conductivity effect. Moreover, the apparent delocalization of the current into the diamond persists when an insulating layer is inserted between the metallic wire and the diamond or when the metallic wire is replaced by a graphene ribbon. The possibilities of a measurement error, a problem in the data analysis, or a current-induced magnetization effect are discussed, but do not seem to offer a more plausible explanation for the effect. Understanding and mitigating this apparent anomaly will be crucial for future applications of NV magnetometry to charge transport studies.
作者: J.-P. Tetienne,N. Dontschuk,D. A. Broadway,S. E. Lillie,T. Teraji,D. A. Simpson,A. Stacey,L. C. L. Hollenberg
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To analyze the magnetic field generated by a continuous current in metallic microwires on a diamond substrate using NV magnetometry and resolve an apparent anomaly in the field measurements.

The study identifies an anomaly in magnetic field measurements from currents in metallic wires on diamond, where the field components violate classical electrodynamics laws under the assumption of current confinement to the wire. By allowing current sources above and below the NV layer, the data are fully explained, indicating significant current flow in the diamond with lateral spread. No actual electrical conduction occurs, ruling out conventional effects. The anomaly is robust across samples and conditions, suggesting it may impact NV magnetometry applications in charge transport studies, and further investigation is needed to understand the underlying physics.

The experiments are limited to room temperature and specific diamond samples with NV layers at shallow depths. The spatial resolution is constrained by the optical diffraction limit (~500 nm). Systematic errors in magnetic field measurements (up to 2 μT) and truncation artifacts in current density reconstruction affect accuracy. The apparent current delocalization into the diamond lacks a clear physical explanation and may be influenced by laser intensity and NV layer properties.

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