研究目的
To investigate the dependence of device performance on the thickness and morphology of the PCBM and PCBM/ZnO electron transport bilayer in perovskite solar cells (PSCs) and to reduce the interface loss due to charge recombination and device degradation.
研究成果
The implementation of a PCBM/ZnO electron transport bilayer significantly improves the performance, hysteresis behavior, and atmospheric stability of p-i-n type planar PSCs. The optimal PCBM/ZnO bilayer-based device achieved a PCE of 15.63% (Max. 16.39%) with negligible hysteresis, demonstrating the potential for high-efficiency and durable perovskite solar cells.
研究不足
The study focused on the optimization of PCBM and ZnO layer thicknesses and their impact on device performance. Potential areas for optimization include further reducing interface resistance and leakage current, and enhancing the stability and efficiency of PSCs under various environmental conditions.
1：Experimental Design and Method Selection:
The study involved the fabrication of p-i-n type planar PSCs with a structure of ITO/NiOx/CH3NH3PbI3/PCBM/ZnO NPs/Ag. The thicknesses of PCBM and ZnO layers were varied to optimize device performance.
2：Sample Selection and Data Sources:
Pre-patterned ITO glass substrates were used. The perovskite layer was fabricated on top of a NiOx layer, and PCBM/ZnO bilayer was formed by spin-coating.
3：List of Experimental Equipment and Materials:
Equipment included a spin-coater, thermal evaporator, solar simulator, FE-SEM, AFM, spectrofluorophotometer, and transient photovoltage/photocurrent measurement systems. Materials included ITO glass, NiOx precursor, CH3NH3PbI3 perovskite precursor, PCBM, ZnO NPs dispersion, and Ag electrodes.
4：Experimental Procedures and Operational Workflow:
The process involved cleaning ITO substrates, spin-coating NiOx and perovskite layers, spin-coating PCBM and ZnO layers at various rates, and depositing Ag electrodes. Device performance was measured under standard AM
5：5G condition. Data Analysis Methods:
Performance parameters (PCE, VOC, JSC, FF) were measured. Surface morphology and roughness were analyzed using FE-SEM and AFM. Charge carrier dynamics were studied using PL, TPV, and TPC measurements.
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Spectrofluorophotometer
RF-6000
SHIMADZU
Used to measure steady-state photoluminescence (PL).
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Oscilloscope
DPO-2014B
Tektronix
Used in conjunction with the T4000 for TPV and TPC measurements.
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Field emission scanning electron microscope
SU-70/S-4800
Hitachi
Used to observe the surface morphology and roughness of thin films.
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ITO glass-substrates
10 Ohm sq-1
Samsung Corning
Used as transparent conductive electrodes in the fabrication of perovskite solar cells.
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NiOx precursor
Sigma-Aldrich
Used to form the hole transport layer (HTL) in perovskite solar cells.
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CH3NH3PbI3 perovskite precursor
Alfa Aesar, Dyesol
Used as the active layer in perovskite solar cells.
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PCBM
Used as an electron transport layer (ETL) in perovskite solar cells.
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ZnO NPs dispersion
< 10 nm
Nano Clean Tech
Used as an electron transport interlayer in perovskite solar cells.
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Ag electrodes
Used as metal electrodes in perovskite solar cells.
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Source measurement unit instrument
Model 2400 SourceMater
Keithley Instruments
Used to measure the performance of solar cells.
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Solar simulator
SoI3A Class AAA
Oriel Instruments
Used to simulate sunlight for testing solar cells under standard AM 1.5G condition.
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Standard Si solar cell
SRC-1000-TC-KG5-N
VLSI standards, Inc.
Used for calibration of the measurement system.
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Quantum Efficiency Measurement System
IQE-200
Oriel Instruments
Used to measure the external quantum efficiency (EQE) spectra of solar cells.
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Atomic force microscopy
XE7
Park system
Used to measure the surface roughness of thin films.
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Multi-functional organic semiconductor parameter test system
T4000
McScience
Used for transient photovoltage (TPV) and transient photocurrent (TPC) measurements.
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