研究目的
Investigating the effect of oxygen precipitation in silicon wafers on the electrical characteristics of fully ion-implanted n-type PERT solar cells.
研究成果
The study demonstrates that oxygen precipitation significantly affects the electrical characteristics of fully ion-implanted n-type PERT solar cells, with higher densities of oxygen precipitates leading to lower conversion efficiencies. The findings highlight the importance of controlling oxygen precipitation in silicon wafers for high-efficiency solar cell fabrication.
研究不足
The study is limited to silicon wafers from the top part of the MCZ ingot with low oxygen concentrations. The effect of oxygen precipitation on solar cell performance may vary with different wafer specifications and processing conditions.
1:Experimental Design and Method Selection:
Fabrication of fully ion-implanted n-type PERT solar cells with boron-implanted emitter and phosphorus-implanted back surface field on n-type silicon wafers.
2:Sample Selection and Data Sources:
Silicon wafers from the top part of the magnetic field-applied Czochralski ingot with low oxygen concentrations.
3:List of Experimental Equipment and Materials:
Magnetic field-applied Czochralski (MCZ) (001) silicon wafers, beamline implanter equipped with a mass analyzer, Fourier transform infrared (FTIR) spectrometer.
4:Experimental Procedures and Operational Workflow:
Texturing of the wafer, boron and phosphorus implantation, post-implantation annealing, passivation layer deposition, screen-printing of Al/Ag and Ag, co-firing.
5:Data Analysis Methods:
Internal quantum efficiency (IQE) measurement, photoluminescence (PL), and wet chemical etching characterizations.
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