研究目的
To demonstrate in situ wavelength tuning of quantum-dot single-photon sources integrated on a CMOS-processed silicon waveguide for scalable quantum photonic integrated circuits.
研究成果
The study successfully demonstrated in situ wavelength tuning of integrated QD SPSs on a silicon CMOS chip using transfer printing and optical heating pads. This approach facilitates the scalable integration of multiple identical QD SPSs, essential for large-scale quantum photonic integrated circuits. Future work could explore alternative tuning techniques and improve thermal insulation between sources.
研究不足
The thermal tuning range was limited compared to previous reports, likely due to heat dissipation into the glass clad. The process of transferring QD sources is currently manual and time-consuming. The photon coupling efficiency was lower than designed, attributed to fabrication imperfections and positioning inaccuracies.
1:Experimental Design and Method Selection:
The study employed transfer printing for hybrid integration of InAs/GaAs quantum dot single-photon sources onto silicon waveguides. Thermal tuning of QD emission wavelengths was achieved using optically driven heating pads.
2:Sample Selection and Data Sources:
InAs/GaAs QD SPSs were fabricated and characterized before integration. Silicon waveguides were prepared using CMOS foundry processes.
3:List of Experimental Equipment and Materials:
A continuous wave diode laser (785 nm), a Ti:sapphire laser (920 nm), superconducting nanowire single-photon detectors, and a grating spectrometer with an InGaAs camera were used.
4:Experimental Procedures and Operational Workflow:
QD SPSs were picked and placed onto silicon waveguides using transfer printing. Heating pads were added for thermal tuning. PL measurements were conducted at low temperatures.
5:Data Analysis Methods:
Emission wavelengths and Q-factors were analyzed from PL spectra. Second-order correlation functions were measured to confirm single-photon generation.
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