研究目的
Investigating the photoluminescence (PL) emission properties of silicon nanocrystals prepared by pulsed laser ablation in He-N2 gas mixtures for bioimaging applications.
研究成果
The addition of nitrogen to helium atmosphere during pulsed laser ablation of silicon target drastically changed PL properties of the prepared Si-based nanostructured films, enabling the generation of a five-fold stronger PL band in the green-yellow spectral range. This tuning opportunity for the PL properties looks very promising for projected bioimaging applications.
研究不足
The study is limited to the characterization of PL properties of Si nanocrystals prepared by pulsed laser ablation in He-N2 gas mixtures. The potential bioimaging applications are suggested but not experimentally validated in this study.
1:Experimental Design and Method Selection:
Pulsed laser ablation from a silicon target in He-N2 gas mixtures at reduced pressures (0.5–5 Torr) was used to fabricate Si nanocrystal-based films. The PL emission properties were studied under different He/N2 ratios.
2:5–5 Torr) was used to fabricate Si nanocrystal-based films. The PL emission properties were studied under different He/N2 ratios.
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Single-crystal (100)-oriented Si wafers were used as targets and substrates. The samples were characterized using SEM, TEM, FTIR-ATR, Raman spectroscopy, and PL measurements.
3:List of Experimental Equipment and Materials:
KrF excimer laser (248 nm), SEM system (TESCAN MAIA 3), TEM (LEO912 AB OMEGA), FTIR spectrometer (Tensor 27), confocal micro-Raman spectrometer (Confotec MR350), and Mightex HRS CCD-spectrometer.
4:Experimental Procedures and Operational Workflow:
The target was ablated using a KrF excimer laser in He-N2 gas mixtures. The ablated material was deposited on a substrate placed 2 cm from the target. The films were characterized for morphology, composition, crystallinity, and PL properties.
5:Data Analysis Methods:
PL spectra and transients were analyzed to understand the emission properties and recombination mechanisms in the Si nanocrystals.
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