研究目的
Developing effective shielding materials providing protect from short wavelength radiation harmful to human eyes, skin, and biological genomes.
研究成果
The Eu3+-doped CsPbBr3 glass ceramic (EGC) exhibits excellent short wavelength shielding and high visible light transparency, making it an ideal candidate for short wavelength shielding materials. The material's structural stability and shielding efficiency under different conditions were systematically studied, demonstrating its potential for practical applications in UV-shielding windows, packaging materials, and functional optical glass.
研究不足
The study focuses on the shielding of short wavelength radiation and does not address the potential effects of long-term exposure to the materials developed. Additionally, the environmental impact of the materials and their production process is not discussed.
1:Experimental Design and Method Selection:
Eu3+-doped CsPbBr3 glass ceramic (EGC) samples were synthesized by a melting-quenching route and subsequent crystallization (heat-treatment). The glass matrix and perovskite-related components were designed with molar compositions of 35B2O3‐35SiO2‐15ZnO-9Cs2CO3-3PbBr2-3NaBr-xEu2O3 (0.1-4.0 mol%).
2:1-0 mol%). Sample Selection and Data Sources:
2. Sample Selection and Data Sources: The raw materials of B2O3(99.9%), SiO2(99.99%), ZnO(99.9%), Cs2CO3(99.99%), PbBr2(99.9%), NaBr(99.99 %), and high purity Eu2O3(99.99 %) were well mixed and grounded into powders with an agate mortar and pestle.
3:9%), SiO2(99%), ZnO(9%), Cs2CO3(99%), PbBr2(9%), NaBr(99 %), and high purity Eu2O3(99 %) were well mixed and grounded into powders with an agate mortar and pestle. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Alumina crucible, stainless steel plate, brass plate, muffle furnace, X-ray diffractometer (D8ADVANCE/Germany Bruker), transmission electron microscopy (TEM) and high-resolution field transmission electron microscopy (HRTEM) using U.S. FEI TecnaiG2 F20 operating at 200 kV, fluorescence spectrophotometer (HITACHI F-7000), spectrophotometer (FLAME-S-XR1-ES), UV-Vis spectrophotometer (Model HITACHI U-4100), time-resolved fluorescence spectrophotometer (FLS920, Edinburgh Instrument Ltd), thermogravimetric analyzer (TGA, Pyris 1 TGA, Per-kin-Elmer).
4:Experimental Procedures and Operational Workflow:
The well-ground stoichiometric compounds were put into an alumina crucible and melted at 1200 °C for 15 min in air atmosphere. After that, the melt was poured into a 400 °C preheated stainless steel plate and then pressed by another brass plate to form precursor glass. Subsequently, the glasses were annealed in a muffle furnace at 400 °C for 3 hours to release the thermal stress, precursor glasses (labeled as PG) were formed. Moreover, the pre-obtained PG was heat-treated for 22 h at 500 °C to form a transparent glass ceramic (labeled as GC). Finally, samples were optical polished or grounded into powders for further characterization and usage.
5:Data Analysis Methods:
The phase of obtained samples were identified via XRD measurement. The microstructures of GCs were analyzed by TEM and HRTEM. The photo-luminescence excitation (PLE) and photo-luminescence (PL) spectra were measured with a fluorescence spectrophotometer. The UV-Vis transmittance spectra and absorption spectra were recorded in the wavelength range from 200 to 800 nm. The decay curves of EGC were recorded by a time-resolved fluorescence spectrophotometer. Thermostability was investigated by thermogravimetric analyzer.
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Transmission electron microscopy
TecnaiG2 F20
FEI
Analyzing the microstructures of GCs
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Fluorescence spectrophotometer
F-7000
HITACHI
Measuring photo-luminescence excitation (PLE) and photo-luminescence (PL) spectra
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Spectrophotometer
U-4100
HITACHI
Recording UV-Vis transmittance spectra and absorption spectra
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Time-resolved fluorescence spectrophotometer
FLS920
Edinburgh Instrument Ltd
Recording decay curves of EGC
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Thermogravimetric analyzer
Pyris 1 TGA
Per-kin-Elmer
Investigating thermostability
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X-ray diffractometer
D8ADVANCE
Bruker
Identifying the phase of obtained samples
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